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• Test-Fix-Test Data (Failure Terminated) Reference Example
  This example validates the results for test-fix-test data (failure terminated) in RGA. ...ard IEC 61164 (Reliability Growth in Product Design and Test – Statistical Test and Estimation Methods), Example 2 – Case 1, pg. 30.
  2 KB (235 words) - 18:27, 28 September 2015
• Test-Fix-Find-Test Data Reference Example
  {{Reference Example|{{Banner RGA Reference_Examples}}|Test-Fix-Find-Test Data}} This example validates the results for test-fix-find-test data in RGA.
  2 KB (268 words) - 18:27, 28 September 2015
• Test-Fix-Find-Test Data Example
  #What is the rate at which unique BD modes are being generated during this test? #If the test continues for an additional 50 hours, what is the minimum number of new uni
  5 KB (727 words) - 21:23, 18 September 2023
• Test-Fix-Test Data Reference Example
  {{Reference Example|{{Banner RGA Reference_Examples}}|Test-Fix-Test Data}} This example validates the results for test-fix-test data (time terminated) in RGA.
  2 KB (227 words) - 18:26, 28 September 2015
• Test-Find-Test Data Reference Example
  {{Reference Example|{{Banner RGA Reference_Examples}}|Test-Find-Test Data}} This example validates the results for test-find-test data in RGA.
  3 KB (392 words) - 18:26, 28 September 2015
• Test-Find-Test Data Example
  ...<math>{{N}_{j}}\,\!</math>, and the total number of BD failures during the test is <math>{{N}_{BD}}=\underset{j=1}{\overset{M}{\mathop{\sum }}}\,{{N}_{j}}\ |colspan="7" style="text-align:center"|'''Test-Find-Test Data'''
  6 KB (731 words) - 21:30, 18 September 2023
• Test Incident
  23 bytes (3 words) - 20:04, 25 June 2015
• ALTA Test Plan Example
  ...with a probability of 99.999% at 120 N · m. The following setup shows the test plan in ALTA. [[Image:1testplan.png|center|650px|Test plan setup for a single stress test.]]
  3 KB (523 words) - 19:04, 18 September 2023
• Likelihood Ratio Test
  26 bytes (3 words) - 21:25, 23 June 2015
• Reliability Test Design
  {{template:LDABOOK|22|Reliability Test Design}} ...rate if the product reliability can meet the requirement. For this type of test design, four methods are supported in Weibull++:
  22 KB (3,517 words) - 21:22, 10 December 2015
• ALTA Test Plan
  35 bytes (4 words) - 21:13, 24 May 2013
• Likelihood Ratio Test Example
  [[Image:3linedplot.png|center|700px|Probability plot of the three test stress levels.]] ...e made with the LR test, which can be performed using the Likelihood Ratio Test tool in ALTA. For example, in the following figure, the <math>\beta s\,\!</
  2 KB (231 words) - 19:04, 18 September 2023
• Test Design Articles
  23 bytes (3 words) - 22:20, 15 September 2023
• Accelerated Life Test Plans
  <noinclude>{{Template:ALTABOOK|Additional Tools|Accelerated Life Test Plans}}</noinclude> ...of the different stress types' levels). This section presents some common test plans for one-stress and two-stress accelerated tests.
  16 KB (2,516 words) - 19:20, 15 September 2023
• Simulation for Test Design
  80 bytes (10 words) - 00:21, 30 June 2015
• Weibull++ Test Design RDT
  60 bytes (8 words) - 21:25, 10 July 2015
• Bayesian Nonparametric Test Design
  37 bytes (4 words) - 08:56, 9 August 2012
• Weibull++ Test Design RDT PlotTable
  70 bytes (9 words) - 21:26, 10 July 2015
• Logistic Model - Missile Launch Test Example
  ...t, it was recorded as a failure. Note that, at this development stage, the test did not consider whether or not the target was destroyed.
  2 KB (283 words) - 21:23, 18 September 2023
• Parametric Binomial Reliability Demonstration Test
  This example validates the results for a parametric binomial test design in Weibull++. ...1,000 hours with 50% confidence, 15 samples are tested for a zero failure test. How many hours should these samples be tested? The failure times are assum
  787 bytes (109 words) - 16:25, 28 September 2015

Page text matches

• Crow Extended Model Examples
  ===Test-Find-Test Data=== {{:Test-Find-Test_Data_Example}}
  1 KB (154 words) - 21:14, 18 September 2023
• Logistic Model Examples
  ==Missile Launch Test Example== ===Missile Launch Test with Modes===
  893 bytes (105 words) - 20:36, 18 September 2023
• Repairable System Test Design Example - Solve for Sample Size
  ...nce. The available time for the demonstration test is 4,000 hours for each test unit. Assuming zero failures are allowed, what is the required number of un ...en that in order to demonstrate a 10,000 hours MTBF with 80% confidence, 5 test units will be required.
  1 KB (193 words) - 20:55, 18 September 2023
• Exponential Chi-Squared Example
  ...e (or <math>CL=0.9\,\!</math>) if no more than 2 failures occur during the test (<math>f=2\,\!</math>). The chi-squared value can be determined from tables This means that 16,374 hours of total test time needs to be accumulated with no more than two failures in order to dem
  1 KB (196 words) - 18:55, 18 September 2023
• Failure Times - Duane Example
  ...ototype of a system was tested with design changes incorporated during the test. A total of 12 failures occurred. The data set is given in the following ta |+'''Developmental Test Data'''
  2 KB (222 words) - 21:16, 18 September 2023
• Parametric Binomial Example - Demonstrate MTTF
  ...!</math>. We want to determine the number of units to test for <math>{{t}_{TEST}}=60\,\!</math> hours to demonstrate this goal. ...e as the reliability demonstration example. Next, the value of <math>{{R}_{TEST}}\,\!</math> is calculated as:
  2 KB (360 words) - 18:55, 18 September 2023
• Difference Detection Matrix
  #REDIRECT [[Reliability Test Design]]
  37 bytes (4 words) - 08:09, 29 June 2012
• Test Design Using Expected Failure Time Plots
  #REDIRECT [[Reliability Test Design]]
  37 bytes (4 words) - 08:04, 29 June 2012
• Parametric Binomial Example - Demonstrate Reliability
  ...=100\,\!</math> hours with a 95% confidence if no failure occur during the test. We will assume a Weibull distribution with a shape parameter <math>\beta = '''Determining Units for Available Test Time'''
  3 KB (470 words) - 18:30, 18 September 2023
• Sequential Data - Duane Example
  #What is the instantaneous Reliability at the end of the test? #How many additional test runs with a one-sided 90% confidence level are required to meet an instanta
  2 KB (232 words) - 21:22, 18 September 2023
• Circuit Boards Example
  27 circuit boards were put in an accelerated life test, with temperature as the stress (or stimuli). The goal is to estimate the r ! colspan="3" align="center"|Test Chamber Temperature 463K
  3 KB (350 words) - 02:45, 16 August 2012
• ALTA Test Plan Example
  ...with a probability of 99.999% at 120 N · m. The following setup shows the test plan in ALTA. [[Image:1testplan.png|center|650px|Test plan setup for a single stress test.]]
  3 KB (523 words) - 19:04, 18 September 2023
• Non-Parametric Binomial Test Design Example
  A reliability engineer wants to design a zero-failure demonstration test in order to demonstrate a reliability of 80% at a 90% confidence level. Use By substituting <math>f=0\,\!</math> (since it a zero-failure test) the non-parametric binomial equation becomes:
  2 KB (266 words) - 18:55, 18 September 2023
• Expected Failure Times Plot Example
  ...e allocated for the test, and the test engineers want to know how long the test will last if all the units are tested to failure. Based on previous experim ...see the upper bound of the last failure is about 955 hours. Therefore, the test probably will last for around 955 hours.
  2 KB (233 words) - 18:55, 18 September 2023
• Interval Data Example
  ...test chamber contains 50 units and is set to a different temperature. The test is performed continuously for 15 weeks, but monitored only on a weekly basi ...ath> life (in hours) of the electronic device. The data obtained from the test are recorded in an ALTA standard folio, using the interval data format, as
  2 KB (254 words) - 01:54, 15 August 2012
• Multi-Phase Example
  ...evaluation every 1,000 hours. The cumulative test times at the end of each test phase are 5,000; 15,000; 25,000; 35,000; 45,000 and 60,000 hours. ...ng|center|400px|Portion of test results for a six-phase reliability growth test program.]]
  3 KB (455 words) - 21:20, 18 September 2023
• Likelihood Ratio Test Example
  [[Image:3linedplot.png|center|700px|Probability plot of the three test stress levels.]] ...e made with the LR test, which can be performed using the Likelihood Ratio Test tool in ALTA. For example, in the following figure, the <math>\beta s\,\!</
  2 KB (231 words) - 19:04, 18 September 2023
• Two Level Optimum Test Plan for One Stress
  This example validates the results for the 2 level statistically optimum test plan for one stress in ALTA. The planning values of the model parameters for the test plan are <math>\beta\,\!</math> = 1.667, &nbsp; <math>\beta_{0}\,\!</math>
  3 KB (471 words) - 18:23, 28 September 2015
• Edit Existing Synthesis Resources/VBA
  ...ing|"C:\RSRepository1.rsr11"}}){{APIComment|'Replace with name and path to test repository.}} ...ry.Project.SetCurrentProject(1){{APIComment|'Replace with the object ID of test project.}}
  1 KB (142 words) - 18:16, 3 April 2017
• Reliability Demonstration Test Design for Repairable Systems
  {{template:RGA BOOK|8|Reliability Demonstration Test Design for Repairable Systems}} ...ration tests for repairable systems. For example, you may want to design a test to demonstrate a specific cumulative MTBF for a specific operating period a
  2 KB (388 words) - 15:09, 14 February 2019