Generalized Eyring Example

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The following data set represents failure times (in hours) obtained from an electronics epoxy packaging accelerated life test performed to understand the synergy between temperature and humidity and estimate the [math]\displaystyle{ B10 }[/math] life at the use conditions of [math]\displaystyle{ T=350K }[/math] and [math]\displaystyle{ H=0.3 }[/math]. The data set is modeled using the lognormal distribution and the generalized Eyring model.

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The probability plot at the use conditions is shown next.

The [math]\displaystyle{ B10 }[/math] information is estimated to be 1967.2 hours, as shown next.