Arrhenius-Lognormal Model for Interval Data

From ReliaWiki
Revision as of 18:43, 11 June 2014 by Kate Racaza (talk | contribs) (Created page with '{{Reference Example|ALTA_Reference_Examples_Banner.png|ALTA_Reference_Examples}} This example compares the results for the Arrhenius-Lognormal model with interval data. {{Ref…')
(diff) ← Older revision | Latest revision (diff) | Newer revision → (diff)
Jump to navigation Jump to search

ALTA_Reference_Examples_Banner.png

ALTA_Reference_Examples

This example compares the results for the Arrhenius-Lognormal model with interval data.


Reference Case

The data set is from Example 19.11 on page 508 in the book Statistical Methods for Reliability Data by Dr. Meeker and Dr. Escobar, John Wiley & Sons, 1998.


Data

The data set for a new-technology IC Device is given below.

Number in Group Last Inspected (Hr) State F/S Time to State Temperature (K)
50 788 S 1536 423.15
50 788 S 1536 448.15
50 96 S 96 473.15
1 384 F 788 523.15
3 788 F 1536 523.15
5 1536 F 2304 523.15
41 1536 S 2304 523.15
4 192 F 384 573.15
27 384 F 788 573.15
16 788 F 1536 573.15
3 788 S 1536 573.15


Result

The following function is used for the Ln-Mean [math]\displaystyle{ \mu'\,\! }[/math] of the lognormal distribution:

[math]\displaystyle{ \mu' = \beta_{0}+\beta_{1} \times \frac{11605}{T}\,\! }[/math]


where T is the temperature; [math]\displaystyle{ \beta_{1}\,\! }[/math] is the activation energy; 11605 is calculated from the reciprocal of the Boltzmann constant. This function can be written in the following way:



Results in ALTA