Appendix D: References

References

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• Cramer, H., [math]\displaystyle{ Mathematical }[/math] [math]\displaystyle{ Methods }[/math] [math]\displaystyle{ of }[/math] [math]\displaystyle{ Statistics }[/math] , Princeton University Press, Princeton, NJ, 1946.

• Cox, F. R., and Lewis, P.A. W. (1966), The Statistical Analysis of Series of Events, London: Methuen.

• Davis, D.J., ``An Analysis of Some Failure Data, J. Am. Stat. Assoc., Vol. 47, p. 113, 1952.

• Dietrich, D., [math]\displaystyle{ SIE }[/math] [math]\displaystyle{ 530 }[/math] [math]\displaystyle{ Engineering }[/math] [math]\displaystyle{ Statistics }[/math] [math]\displaystyle{ Lecture }[/math] [math]\displaystyle{ Notes }[/math] , The University of Arizona, Tucson, Arizona.

• Dudewicz, E.J., ``An Analysis of Some Failure Data, J. Am. Stat. Assoc., Vol. 47, p. 113, 1952.

• Dudewicz, E.J., and Mishra, Satya N., [math]\displaystyle{ Modern }[/math] [math]\displaystyle{ Mathematical }[/math] [math]\displaystyle{ Statistics }[/math] , John Wiley & Sons, Inc., New York, 1988.

• Evans, Ralph A., ``The Lognormal Distribution is Not a Wearout Distribution, Reliability Group Newsletter, IEEE, Inc., 345 East 47 [math]\displaystyle{ ^{th} }[/math] St., New York, N.Y. 10017, p. 9, Vol. XV, Issue 1, January 1970.

• Gelman, A., Carlin, John B., Stern, Hal S., and Rubin, Donald B., Bayesian Data Analysis, Second Edition, Chapman & Hall/CRC, New York 2004

• Gottfried, Paul, Wear-out, Reliability Group Newsletter, IEEE, Inc., 345 East 47 [math]\displaystyle{ ^{th} }[/math] St., New York, N.Y. 10017, p. 7, Vol. XV, Issue 3, July 1970.

• Hahn, Gerald J., and Shapiro, Samuel S., [math]\displaystyle{ Statistical }[/math] [math]\displaystyle{ Models }[/math] [math]\displaystyle{ in }[/math] [math]\displaystyle{ Engineer }[/math] - [math]\displaystyle{ ing }[/math] , John Wiley & Sons, Inc., New York, 355 pp., 1967.

• Hald, A., [math]\displaystyle{ Statistical }[/math] [math]\displaystyle{ Theory }[/math] [math]\displaystyle{ with }[/math] [math]\displaystyle{ Engineering }[/math] [math]\displaystyle{ Applications }[/math] , John Wiley & Sons, Inc., New York, 783 pp., 1952.

• Hald, A., [math]\displaystyle{ Statistical }[/math] [math]\displaystyle{ Tables }[/math] [math]\displaystyle{ and }[/math] [math]\displaystyle{ Formulas }[/math] , John Wiley & Sons, Inc., New York, 97 pp., 1952.

• Hirose, Hideo, ``Maximum Likelihood Estimation in the 3-parameter Weibull Distribution - A Look through the Generalized Extreme-value Distribution, IEEE Transactions on Dielectrics and Electrical Insulation, Vol. 3, No. 1, pp. 43-55, February 1996.

• Johnson, Leonard G., ``The Median Ranks of Sample Values in their Population With an Application to Certain Fatigue Studies, Industrial Mathematics, Vol. 2, 1951.

• Johnson, Leonard G., [math]\displaystyle{ The }[/math] [math]\displaystyle{ Statistical }[/math] [math]\displaystyle{ Treatment }[/math] [math]\displaystyle{ of }[/math] [math]\displaystyle{ Fatigue }[/math] [math]\displaystyle{ Experi }[/math] - [math]\displaystyle{ ment }[/math] , Elsevier Publishing Company, New York, 144 pp., 1964.

• Kao, J.H.K., ``A New Life Quality Measure for Electron Tubes, IRE Transaction on Reliability and Quality Control, PGRQC 13, pp. 15-22, July 1958.

• Kapur, K.C., and Lamberson, L.R., [math]\displaystyle{ Reliability }[/math] [math]\displaystyle{ in }[/math] [math]\displaystyle{ Engineering }[/math] [math]\displaystyle{ Design }[/math] , John Wiley & Sons, Inc., New York, 586 pp., 1977.

• Kececioglu, Dimitri, [math]\displaystyle{ Reliability }[/math] [math]\displaystyle{ Engineering }[/math] [math]\displaystyle{ Handbook }[/math] , Prentice Hall, Inc., Englewood Cliffs, New Jersey, Vol. 1, 1991.

• Kececioglu, Dimitri, [math]\displaystyle{ Reliability }[/math] [math]\displaystyle{ \And }[/math] [math]\displaystyle{ Life }[/math] [math]\displaystyle{ Testing }[/math] [math]\displaystyle{ Handbook }[/math] , Prentice Hall, Inc., Englewood Cliffs, New Jersey, Vol. 1 and 2, 1993 and 1994.

• Lawless, J.F., Statistical Models And Methods for Lifetime Data, John Wiley & Sons, Inc., New York, 1982.

• Leemis, Lawrence M., [math]\displaystyle{ Reliability-Probabilistic }[/math] [math]\displaystyle{ Models }[/math] [math]\displaystyle{ and }[/math] [math]\displaystyle{ Statistical }[/math] [math]\displaystyle{ Methods }[/math] , Prentice Hall, Inc., Englewood Cliffs, New Jersey, 1995.

• Lieblein, J., and Zelen, M., Statistical Investigation of the Fatigue Life of Deep-Groove Ball Bearings, Journal of Research, National Bureau of Standards, Vol. 57, p. 273, 1956.

• Lloyd, David K., and Lipow Myron, [math]\displaystyle{ Reliability }[/math] : [math]\displaystyle{ Management, }[/math] [math]\displaystyle{ Methods, }[/math] [math]\displaystyle{ and }[/math] [math]\displaystyle{ Mathematics }[/math] , Prentice Hall, Englewood Cliffs, New Jersey, 1962.

• Mann, Nancy R., Schafer, Ray. E., and Singpurwalla, Nozer D., [math]\displaystyle{ Methods }[/math] [math]\displaystyle{ for }[/math] [math]\displaystyle{ Statistical }[/math] [math]\displaystyle{ Analysis }[/math] [math]\displaystyle{ of }[/math] [math]\displaystyle{ Reliability }[/math] [math]\displaystyle{ and }[/math] [math]\displaystyle{ Life }[/math] [math]\displaystyle{ Data }[/math] , John Wiley & Sons, Inc., New York, 1974.

• Martz, H. F. and Waller, R. A. Bayesian Reliability Analysis, John Wiley & Sons, Inc., New York, 1982.

• Meeker, W.Q., and Escobar, L.A., Statistical Methods for Reliability Data, John Wiley & Sons, Inc., New York, 1998.

• Mettas, A, and Zhao, Wenbiao, Modeling and Analysis of Repairable Systems with General Repair, 2005 Proceedings Annual Reliability and Maintainability Symposium, Alexandria, Virginia, 2005.

• Montgomery, Douglas C., Design and Analysis of Experiments, John Wiley & Sons, Inc., New York, 1991.

• Nelson, Wayne, [math]\displaystyle{ Applied }[/math] [math]\displaystyle{ Life }[/math] [math]\displaystyle{ Data }[/math] [math]\displaystyle{ Analysis }[/math] , John Wiley & Sons, Inc., New York, 1982.

• Nelson, Wayne, Recurrent Events Data Analysis for Product Repairs, Disease Recurrences, and Other Applications, ASA-SIAM, 2003.

• NIST/SEMATECH e-Handbook of Statistical Methods, http://www.itl.nist.gov/div898/handbook/, September, 2005.

• Perry, J. N., Semiconductor Burn-in and Weibull Statistics, Semiconductor Reliability, Vol. 2, Engineering Publishers, Elizabeth, N.J., pp. 8-90, 1962.

• Procassini, A. A., and Romano, A., Transistor Reliability Estimates Improve with Weibull Distribution Function, Motorola Military Products Division, Engineering Bulletin, Vol. 9, No. 2, pp. 16-18, 1961.

• Weibull, Wallodi, A Statistical Representation of Fatigue Failure in Solids, Transactions on the Royal Institute of Technology, No. 27, Stockholm, 1949.

• Weibull, Wallodi, A Statistical Distribution Function of Wide Applicability, Journal of Applied Mechanics, Vol. 18, pp. 293-297, 1951.

• Wingo, Dallas R., Solution of the Three-Parameter Weibull Equations by Constrained Modified Quasilinearization (Progressively Censored Samples), IEEE Transactions on Reliability, Vol. R-22, No. 2, pp. 96-100, June 1973.