Appendix D: References: Difference between revisions

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#Aitchison, J., Jr. and Brown, J.A.C.,  The Lognormal Distribution , Cambridge University Press, New York, 176 pp., 1957.
#REDIRECT [[Appendix:_Life_Data_Analysis_References]]
#Cramer, H.,  Mathematical Methods    of    Statistics  , Princeton University Press, Princeton, NJ, 1946.
#Cox, F. R., and Lewis, P.A. W. (1966), The Statistical Analysis of Series of Events, London: Methuen.
#Davis, D.J., ``An Analysis of Some Failure Data,  J. Am. Stat. Assoc., Vol. 47, p. 113, 1952.
#Dietrich, D.,  SIE    530    Engineering    Statistics    Lecture    Notes  , The University of Arizona, Tucson, Arizona.
#Dudewicz, E.J., ``An Analysis of Some Failure Data,  J. Am. Stat. Assoc., Vol. 47, p. 113, 1952.
#Dudewicz, E.J., and Mishra, Satya N.,  Modern    Mathematical    Statistics  , John Wiley & Sons, Inc., New York, 1988.
#Evans, Ralph A., ``The Lognormal Distribution is Not a Wearout Distribution,  Reliability Group Newsletter, IEEE, Inc., 345 East 47th  St., New York, N.Y. 10017, p. 9, Vol. XV, Issue 1, January 1970.
#Gelman, A., Carlin, John B., Stern, Hal S., and Rubin, Donald B., Bayesian Data Analysis, Second Edition, Chapman & Hall/CRC, New York 2004
#Gottfried, Paul, Wear-out, Reliability Group Newsletter, IEEE, Inc., 345 East 47  ^{th}  St., New York, N.Y. 10017, p. 7, Vol. XV, Issue 3, July 1970.
#Hahn, Gerald J., and Shapiro, Samuel S.,  Statistical   
Models    in    Engineer  -  ing  , John Wiley & Sons, Inc., New York, 355 pp., 1967.
#Hald, A.,  Statistical    Theory    with    Engineering    Applications  , John Wiley & Sons, Inc., New York, 783 pp., 1952.
#Hald, A.,  Statistical    Tables    and    Formulas  , John Wiley & Sons, Inc., New York, 97 pp., 1952.
#Hirose, Hideo, ``Maximum Likelihood Estimation in the 3-parameter Weibull Distribution - A Look through the Generalized Extreme-value Distribution,  IEEE Transactions on Dielectrics and Electrical Insulation, Vol. 3, No. 1, pp. 43-55, February 1996.
#Johnson, Leonard G., ``The Median Ranks of Sample Values in their Population With an Application to Certain Fatigue Studies,  Industrial Mathematics, Vol. 2, 1951.
#Johnson, Leonard G.,  The    Statistical    Treatment    of    Fatigue    Experi  -  ment  , Elsevier Publishing Company, New York, 144 pp., 1964.
#Kao, J.H.K., ``A New Life Quality Measure for Electron Tubes,  IRE Transaction on Reliability and Quality Control, PGRQC 13, pp. 15-22, July 1958.
#Kapur, K.C., and Lamberson, L.R.,  Reliability    in    Engineering    Design  , John Wiley & Sons, Inc., New York, 586 pp., 1977.
#Kececioglu, Dimitri,  Reliability    Engineering    Handbook  , Prentice Hall, Inc., Englewood Cliffs, New Jersey, Vol. 1, 1991.
#Kececioglu, Dimitri,  Reliability    and      Life    Testing    Handbook  , Prentice Hall, Inc., Englewood Cliffs, New Jersey, Vol. 1 and 2, 1993 and 1994.
# Lawless, J.F., Statistical Models And Methods for Lifetime Data, John Wiley & Sons, Inc., New York, 1982.
# Leemis, Lawrence M.,  Reliability-Probabilistic    Models    and    Statistical    Methods  , Prentice Hall, Inc., Englewood Cliffs, New Jersey, 1995.
#Lieblein, J., and Zelen, M., Statistical Investigation of the Fatigue Life of Deep-Groove Ball Bearings, Journal of Research, National Bureau of Standards, Vol. 57, p. 273, 1956.
#Lloyd, David K., and Lipow Myron,  Reliability  :  Management,    Methods,    and    Mathematics  , Prentice Hall, Englewood Cliffs, New Jersey, 1962.
#Mann, Nancy R., Schafer, Ray. E., and Singpurwalla, Nozer D.,  Methods    for    Statistical    Analysis    of    Reliability    and    Life    Data  , John Wiley & Sons, Inc., New York, 1974.
#Martz, H. F. and Waller, R. A. Bayesian Reliability Analysis, John Wiley & Sons, Inc., New York, 1982.
# Meeker, W.Q., and Escobar, L.A., Statistical Methods for Reliability Data, John Wiley & Sons, Inc., New York, 1998.
# Mettas, A, and Zhao, Wenbiao, Modeling and Analysis of Repairable Systems with General Repair, 2005 Proceedings Annual Reliability and Maintainability Symposium, Alexandria, Virginia, 2005.
# Montgomery, Douglas C., Design and Analysis of Experiments, John Wiley & Sons, Inc., New York, 1991.
# Nelson, Wayne,  Applied    Life    Data    Analysis  , John Wiley & Sons, Inc., New York, 1982.
# Nelson, Wayne, Recurrent Events Data Analysis for Product Repairs, Disease Recurrences, and Other Applications, ASA-SIAM, 2003.
# NIST/SEMATECH e-Handbook of Statistical Methods, http://www.itl.nist.gov/div898/handbook/, September, 2005.
#Perry, J. N., Semiconductor Burn-in and Weibull Statistics, Semiconductor Reliability, Vol. 2, Engineering Publishers, Elizabeth, N.J., pp. 8-90, 1962.
# Procassini, A. A., and Romano, A., Transistor Reliability Estimates Improve with Weibull Distribution Function, Motorola Military Products Division, Engineering Bulletin, Vol. 9, No. 2, pp. 16-18, 1961.
# Weibull, Wallodi, A Statistical Representation of Fatigue Failure in Solids, Transactions on the Royal Institute of Technology, No. 27, Stockholm, 1949.
# Weibull, Wallodi, A Statistical Distribution Function of Wide Applicability, Journal of Applied Mechanics, Vol. 18, pp. 293-297, 1951.
#Wingo, Dallas R., Solution of the Three-Parameter Weibull Equations by Constrained Modified Quasilinearization (Progressively Censored Samples), IEEE Transactions on Reliability, Vol. R-22, No. 2, pp. 96-100, June 1973.

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