Generalized Eyring Example: Difference between revisions

From ReliaWiki
Jump to navigation Jump to search
(added link to ALTA book)
No edit summary
 
(3 intermediate revisions by 2 users not shown)
Line 1: Line 1:
<noinclude>{{Banner_ALTA_Examples}}
<noinclude>{{Banner_ALTA_Examples}}
''This example appears in the [[Eyring_Relationship#Generalized_Eyring_Relationship|Accelerated Life Testing Data Analysis Reference]] book.''
''This example appears in the [https://help.reliasoft.com/reference/accelerated_life_testing_data_analysis Accelerated life testing reference].''


</noinclude>
</noinclude>
The following data set represents failure times (in hours) obtained from an electronics epoxy packaging accelerated life test performed to understand the synergy between temperature and humidity and estimate the <math>B10</math> life at the use conditions of <math>T=350K</math> and <math>H=0.3</math>. The data set is modeled using the lognormal distribution and the generalized Eyring model.
The following data set represents failure times (in hours) obtained from an electronics epoxy packaging accelerated life test performed to understand the synergy between temperature and humidity and estimate the <math>B10\,\!</math> life at the use conditions of <math>T=350K\,\!</math> and <math>H=0.3\,\!</math>. The data set is modeled using the lognormal distribution and the generalized Eyring model.


[[Image:406-1-2.png|center|650px|]]
[[Image:406-1-2.png|center|800px|]]
<math></math>


The probability plot at the use conditions is shown next.
The probability plot at the use conditions is shown next.
Line 12: Line 11:
[[Image:plotfolio426.png|center|550px|]]
[[Image:plotfolio426.png|center|550px|]]
   
   
The <math>B10</math> information is estimated to be 1967.2 hours, as shown next.
The <math>B10\,\!</math> information is estimated to be 1967.2 hours, as shown next.


[[Image:tempBX.png|center|550px|]]
[[Image:tempBX.png|center|550px|]]

Latest revision as of 19:03, 18 September 2023

ALTA Examples Banner.png


New format available! This reference is now available in a new format that offers faster page load, improved display for calculations and images and more targeted search.

As of January 2024, this Reliawiki page will not continue to be updated. Please update all links and bookmarks to the latest references at ALTA examples and ALTA reference examples.




This example appears in the Accelerated life testing reference.


The following data set represents failure times (in hours) obtained from an electronics epoxy packaging accelerated life test performed to understand the synergy between temperature and humidity and estimate the [math]\displaystyle{ B10\,\! }[/math] life at the use conditions of [math]\displaystyle{ T=350K\,\! }[/math] and [math]\displaystyle{ H=0.3\,\! }[/math]. The data set is modeled using the lognormal distribution and the generalized Eyring model.

406-1-2.png

The probability plot at the use conditions is shown next.

Plotfolio426.png

The [math]\displaystyle{ B10\,\! }[/math] information is estimated to be 1967.2 hours, as shown next.

TempBX.png