Template:Example:TNT: Difference between revisions

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(Created page with '==Example== <br> Twelve electronic devices were put into a continuous accelerated test and the following data were collected. <br> <br> [[Image:ALTA10t1.gif|thumb|center|300px|]…')
 
 
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==Example==
#REDIRECT [[Temperature-Nonthermal_Relationship_Example]]
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Twelve electronic devices were put into a continuous accelerated test and the following data were collected.
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[[Image:ALTA10t1.gif|thumb|center|300px|]]
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Using ALTA and the T-NT lognormal model, the following parameters were obtained:
 
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::<math>\begin{align}
  & \widehat{Std}= & 0.1825579885 \\
& \widehat{B}= & 3729.6503028119 \\
& \widehat{C}= & 0.0352919977 \\
& \widehat{n}= & 0.7767966480 
\end{align}</math>
 
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A probability plot for the use stress levels of 323K and 2V is shown next.
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An acceleration factor plot, in which one of the stresses must be kept constant, can also be obtained. For example, in the following plot, the acceleration factor is plotted versus temperature given a constant voltage of 2V, as shown next.
 
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Latest revision as of 02:08, 14 August 2012

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