Template:Example:CD-GLL Weibull: Difference between revisions

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==CD GLL-Weibull Example==
[[Categpry: For Deletion]]
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A sample of 18 units of an electronic component was subjected to temperature and voltage stresses. The temperature was initially set 100K and was then continuously increased to 200K over a period of 20 hours. The temperature was again increased at 120 hours to 300K over a 20 hours period as shown in the next figure.
 
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[[Image:ALTA12.3.gif|thumb|center|400px|Temperature profile.]]
 
 
The voltage was initially set 4V and was then increased continuously to 8V over a period of 10 hours. The voltage was again increased at 110 hours to 12V over a 10 hours period as shown in the next figure.
 
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[[Image:ALTA12.4.gif|thumb|center|400px|Voltage profile.]]
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The failure times, as entered in ALTA, are shown in the next figure.
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[[Image:CD_GLL_Example_3.gif|thumb|center|600px|]]
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The stresses are transformed using an Arrhenius life-stress relationship for temperature, a Power Law life-stress relationship for voltage and the Weibull distribution as the underlying distribution.
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[[Image:CD_GLL_Example_4.gif|thumb|center|400px|]]
 
The estimated model parameters are shown next.
 
 
::<math>\begin{align}
\widehat{\beta }=\ & 3.507277 \\
\widehat{{{\alpha }_{0}}}=\ & -1.377671 \\
\widehat{{{\alpha }_{1}}}=\ & 450.488282 \\
\widehat{{{\alpha }_{2}}}=\ & 1.981082 
\end{align}</math>
 
 
The use level (temperature = 100K, voltage = 4V) reliability plot is shown in the next figure.
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[[Image:ALTA12.5.gif|thumb|center|400px|Reliability plot at normal use conditions (100K and 4V).]]
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Revision as of 07:57, 1 August 2012

Categpry: For Deletion

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