Template:Bayesian test design: Difference between revisions

Latest revision as of 08:04, 29 June 2012

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-==Bayeisan Nonparameteric Test Design==
+#REDIRECT [[Reliability Test Design]]
-The regular nonparametric analysis performed based on either the Binomial or the Chi-Square equation was performed with only the direct system test data.  However, if prior information regarding system performance is available, it can be incorporated into a Bayesian nonparametric analysis.  This subsection will demonstrate how to incorporate prior information about system reliability and also how to incorporate prior information from subsystem tests into system test design.
-===Assumption on System Reliability===
-If we assume the system reliablity follows a Beta distribuiton, the values of system reliability ''R'', confidence level ''CL'', number of units tested ''n'', and number of failures ''r'' are related by the equation.
-::<math>1-CL=\text{Beta}\left(R,\alpha,\beta\right)=\text{Beta}\left(R,n-r+\alpha_{0},r+\beta_{0}\right)</math>
-where Beta is the incomplete Beta function.  If <math>\alpha_{0}</math> and <math>\beta\,\!_{0}</math> are known, then any quantity of interest can be calculated using the remaining three.  The next two examples demonstrate how to calculate <math>\alpha\,\!_{0}</math> and <math>\beta\,\!_{0}</math> depending on the type of prior information available.
-{{btd w info on reliability}}
-{{btd w info from subsystem tests}}