Electronic Devices Example - Revision history

Lisa Hacker at 02:48, 16 August 2012

2012-08-16T02:48:02Z

← Older revision		Revision as of 02:48, 16 August 2012
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	<noinclude>{{Banner ALTA Examples}}</noinclude>		<noinclude>{{Banner ALTA Examples}}</noinclude>
	~~Twelve~~ electronic devices are put into an accelerated life test. The accelerated stresses are temperature and voltage, with use level conditions of 328K and 2V, respectively. The following table shows the data from the test:		12 electronic devices are put into an accelerated life test. The accelerated stresses are temperature and voltage, with use level conditions of 328K and 2V, respectively. The following table shows the data from the test:

Kate Racaza at 04:25, 15 August 2012

2012-08-15T04:25:50Z

← Older revision		Revision as of 04:25, 15 August 2012
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	~~===Electronic Devices Example===~~		<noinclude>{{Banner ALTA Examples}}</noinclude>
			Twelve electronic devices are put into an accelerated life test. The accelerated stresses are temperature and voltage, with use level conditions of 328K and 2V, respectively. The following table shows the data from the test:

	Twelve electronic devices were put into a continuous accelerated test. The accelerated stresses were temperature and voltage, with use level conditions of 328K and 2V respectively. The data set obtained is shown in the table below:

	[[Image:11_2ex.png\|center\|300px\|]]		[[Image:11_2ex.png\|center\|300px\|]]


	Do the following:		Do the following:

	1) Using the T-NT Weibull model, analyze the data ~~in ALTA~~ and determine the MTTF and B(10) life for these devices at use level. Determine the upper and lower 90% 2-sided confidence intervals on the results.		1) Using the T-NT Weibull model, analyze the data and determine the MTTF and B(10) life for these devices at use level. Determine the upper and lower 90% 2-sided confidence intervals on the results.

	2) Examine the effects of each stress on life.		2) Examine the effects of each stress on life.

	~~====Solution====~~

	1. ~~The~~ data set ~~was analyzed~~ in ALTA and the ~~following~~ MTTF and <math>B(10)</math> life ~~results were obtained: (''~~The results are shown ~~in ALTA's QCP in the following figures~~.~~'')~~
			'''Solution'''

			1. Analyze the data set in the ALTA standard folio and use the Quick Calculation Pad (QCP) to compute for the MTTF and <math>B(10)</math> life. The results are shown next.


	[[Image:pv_ex2_1.gif\|center\|500px\|]]		[[Image:pv_ex2_1.gif\|center\|500px\|]]

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	~~2. The next two figures examine the effects of each stress on life.~~

	Specifically, the ~~next~~ figure shows the Life vs. Voltage plot with temperature held constant at 328K.		2. The next two figures examine the effects of each stress on life. Specifically, the first figure shows the Life vs. Voltage plot with the temperature held constant at 328K. The second figure shows the Life vs. Temperature plot with voltage held constant at 2V.


			[[Image:ALTA14.6.gif\|center\|550px\|The effects of voltage on life, with temperature held constant at 328K.]]


	[[Image:ALTA14.6.gif~~\|thumb~~\|center\|550px\|The effects of ~~voltage~~ on life, with ~~temperature~~ held constant at ~~328K~~.]]		[[Image:ALTA14.7.gif\|center\|550px\|The effects of temperature on life, with voltage held constant at 2V.]]

	~~The next figure shows the Life vs. Temperature plot with voltage held constant at 2V.~~

	~~[[Image:ALTA14.7.gif\|thumb\|center\|550px\|~~The ~~effects~~ of temperature ~~on life~~, ~~with~~ voltage ~~held constant at 2V~~.]]		The next figure shows a 3D plot of reliability (at a constant time) versus both stresses. As you can see, the reliability declines slightly faster with the change in temperature than with the change in voltage. Note that in the following plot, Stress 1 refers to temperature and Stress 2 refers to voltage.

	The next figure shows a 3D plot of reliability (at a constant time) versus both stresses. One can observe that reliability declines slightly faster with the change in temperature than with the change in voltage. Note that in the following plot, Stress 1 refers to temperature and Stress 2 refers to voltage.

	[[Image:ALTA14.8.gif~~\|thumb~~\|center\|450px\|The combined effects of voltage and temperature on the reliability, as plotted in ALTA.]]		[[Image:ALTA14.8.gif\|center\|450px\|The combined effects of voltage and temperature on the reliability, as plotted in ALTA.]]

Kate Racaza: moved Template:Electronic Devices Example to Electronic Devices Example: incorrect namespace

2012-08-15T04:18:08Z

moved Template:Electronic Devices Example to Electronic Devices Example: incorrect namespace

← Older revision	Revision as of 04:18, 15 August 2012
(No difference)

Richard House at 07:03, 9 August 2012

2012-08-09T07:03:11Z

← Older revision		Revision as of 07:03, 9 August 2012
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	===Electronic Devices Example===		===Electronic Devices Example===

	~~<br>~~
	Twelve electronic devices were put into a continuous accelerated test. The accelerated stresses were temperature and voltage, with use level conditions of 328K and 2V respectively. The data set obtained is shown in the table below:		Twelve electronic devices were put into a continuous accelerated test. The accelerated stresses were temperature and voltage, with use level conditions of 328K and 2V respectively. The data set obtained is shown in the table below:
	~~<br>~~
	~~<br>~~
	[[Image:11_2ex.png\|center\|300px\|]]		[[Image:11_2ex.png\|center\|300px\|]]
	~~<br>~~
	Do the following:		Do the following:

	1) Using the T-NT Weibull model, analyze the data in ALTA and determine the MTTF and B(10) life for these devices at use level. Determine the upper and lower 90% 2-sided confidence intervals on the results.		1) Using the T-NT Weibull model, analyze the data in ALTA and determine the MTTF and B(10) life for these devices at use level. Determine the upper and lower 90% 2-sided confidence intervals on the results.

	2) Examine the effects of each stress on life.		2) Examine the effects of each stress on life.



	====Solution====		====Solution====
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	1. The data set was analyzed in ALTA and the following MTTF and <math>B(10)</math> life results were obtained: (''The results are shown in ALTA's QCP in the following figures.'')		1. The data set was analyzed in ALTA and the following MTTF and <math>B(10)</math> life results were obtained: (''The results are shown in ALTA's QCP in the following figures.'')

	~~<br>~~		[[Image:pv_ex2_1.gif\|center\|500px\|]]
	[[Image:pv_ex2_1.gif~~\|thumb~~\|center\|500px\|]]

	~~<br>~~
	[[Image:pv_ex2_2.gif~~\|thumb~~\|center\|500px\|]]		[[Image:pv_ex2_2.gif\|center\|500px\|]]
	~~<br>~~
	~~<br>~~


	2. The next two figures examine the effects of each stress on life.		2. The next two figures examine the effects of each stress on life.

	~~<br>~~
	Specifically, the next figure shows the Life vs. Voltage plot with temperature held constant at 328K.		Specifically, the next figure shows the Life vs. Voltage plot with temperature held constant at 328K.

			[[Image:ALTA14.6.gif\|thumb\|center\|550px\|The effects of voltage on life, with temperature held constant at 328K.]]

	~~[[Image:ALTA14~~.~~6.gif\|thumb\|center\|500px\|The effects of~~ voltage ~~on life, with temperature~~ held constant at ~~328K~~.]]		The next figure shows the Life vs. Temperature plot with voltage held constant at 2V.


	The ~~next figure shows the Life vs. Temperature plot~~ with voltage held constant at 2V.		[[Image:ALTA14.7.gif\|thumb\|center\|550px\|The effects of temperature on life, with voltage held constant at 2V.]]

	~~<br>~~
	~~[[Image:ALTA14.7.gif\|thumb\|center\|500px\|The effects of temperature on life, with voltage held constant at 2V.]]~~
	~~<br>~~
	~~<br>~~
	The next figure shows a 3D plot of reliability (at a constant time) versus both stresses. One can observe that reliability declines slightly faster with the change in temperature than with the change in voltage. Note that in the following plot, Stress 1 refers to temperature and Stress 2 refers to voltage.		The next figure shows a 3D plot of reliability (at a constant time) versus both stresses. One can observe that reliability declines slightly faster with the change in temperature than with the change in voltage. Note that in the following plot, Stress 1 refers to temperature and Stress 2 refers to voltage.

			[[Image:ALTA14.8.gif\|thumb\|center\|450px\|The combined effects of voltage and temperature on the reliability, as plotted in ALTA.]]
	[[Image:ALTA14.8.gif\|thumb\|center\|~~400px~~\|The combined effects of voltage and temperature on the reliability, as plotted in ALTA.]]
	~~<br>~~
	~~<br>~~

Chris Kahn: /* Electronic Devices Example */

2012-06-25T13:22:41Z

Electronic Devices Example

← Older revision		Revision as of 13:22, 25 June 2012
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	<br>		<br>
	<br>		<br>
	[[Image:11_2ex.png\|center\|~~150px~~\|]]		[[Image:11_2ex.png\|center\|300px\|]]
	<br>		<br>
	Do the following:		Do the following:
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	<br>		<br>
	[[Image:pv_ex2_1.gif\|thumb\|center\|~~200px~~\|]]		[[Image:pv_ex2_1.gif\|thumb\|center\|500px\|]]

	<br>		<br>
	[[Image:pv_ex2_2.gif\|thumb\|center\|~~200px~~\|]]		[[Image:pv_ex2_2.gif\|thumb\|center\|500px\|]]
	<br>		<br>
	<br>		<br>
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	[[Image:ALTA14.6.gif\|thumb\|center\|~~200px~~\|The effects of voltage on life, with temperature held constant at 328K.]]		[[Image:ALTA14.6.gif\|thumb\|center\|500px\|The effects of voltage on life, with temperature held constant at 328K.]]


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	<br>		<br>
	[[Image:ALTA14.7.gif\|thumb\|center\|~~200px~~\|The effects of temperature on life, with voltage held constant at 2V.]]		[[Image:ALTA14.7.gif\|thumb\|center\|500px\|The effects of temperature on life, with voltage held constant at 2V.]]
	<br>		<br>
	<br>		<br>
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	[[Image:ALTA14.8.gif\|thumb\|center\|~~200px~~\|The combined effects of voltage and temperature on the reliability, as plotted in ALTA.]]		[[Image:ALTA14.8.gif\|thumb\|center\|400px\|The combined effects of voltage and temperature on the reliability, as plotted in ALTA.]]
	<br>		<br>
	<br>		<br>

Chuck Smith: /* Electronic Devices Example */

2012-04-25T23:29:30Z

Electronic Devices Example

← Older revision		Revision as of 23:29, 25 April 2012
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	<br>		<br>
	<br>		<br>
	[[Image:11_2ex.png\|center\|~~350px~~\|]]		[[Image:11_2ex.png\|center\|150px\|]]
	<br>		<br>
	Do the following:		Do the following:
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	<br>		<br>
	[[Image:pv_ex2_1.gif\|thumb\|center\|~~400px~~\|]]		[[Image:pv_ex2_1.gif\|thumb\|center\|200px\|]]

	<br>		<br>
	[[Image:pv_ex2_2.gif\|thumb\|center\|~~400px~~\|]]		[[Image:pv_ex2_2.gif\|thumb\|center\|200px\|]]
	<br>		<br>
	<br>		<br>
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	[[Image:ALTA14.6.gif\|thumb\|center\|~~400px~~\|The effects of voltage on life, with temperature held constant at 328K.]]		[[Image:ALTA14.6.gif\|thumb\|center\|200px\|The effects of voltage on life, with temperature held constant at 328K.]]


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	<br>		<br>
	[[Image:ALTA14.7.gif\|thumb\|center\|~~400px~~\|The effects of temperature on life, with voltage held constant at 2V.]]		[[Image:ALTA14.7.gif\|thumb\|center\|200px\|The effects of temperature on life, with voltage held constant at 2V.]]
	<br>		<br>
	<br>		<br>
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	[[Image:ALTA14.8.gif\|thumb\|center\|~~400px~~\|The combined effects of voltage and temperature on the reliability, as plotted in ALTA.]]		[[Image:ALTA14.8.gif\|thumb\|center\|200px\|The combined effects of voltage and temperature on the reliability, as plotted in ALTA.]]
	<br>		<br>
	<br>		<br>

Nicolette Young: /* Electronic Devices Example */

2012-04-03T17:35:21Z

Electronic Devices Example

← Older revision		Revision as of 17:35, 3 April 2012
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	<br>		<br>
	<br>		<br>
	[[Image:11_2ex.png\|center\|~~300px~~\|]]		[[Image:11_2ex.png\|center\|350px\|]]
	<br>		<br>
	Do the following:		Do the following:
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	<br>		<br>
	[[Image:pv_ex2_1.gif\|thumb\|center\|~~300px~~\|]]		[[Image:pv_ex2_1.gif\|thumb\|center\|400px\|]]

	<br>		<br>
	[[Image:pv_ex2_2.gif\|thumb\|center\|~~300px~~\|]]		[[Image:pv_ex2_2.gif\|thumb\|center\|400px\|]]
	<br>		<br>
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	[[Image:ALTA14.6.gif\|thumb\|center\|~~300px~~\|The effects of voltage on life, with temperature held constant at 328K.]]		[[Image:ALTA14.6.gif\|thumb\|center\|400px\|The effects of voltage on life, with temperature held constant at 328K.]]


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	<br>		<br>
	[[Image:ALTA14.7.gif\|thumb\|center\|~~300px~~\|The effects of temperature on life, with voltage held constant at 2V.]]		[[Image:ALTA14.7.gif\|thumb\|center\|400px\|The effects of temperature on life, with voltage held constant at 2V.]]
	<br>		<br>
	<br>		<br>
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	[[Image:ALTA14.8.gif\|thumb\|center\|~~300px~~\|The combined effects of voltage and temperature on the reliability, as plotted in ALTA.]]		[[Image:ALTA14.8.gif\|thumb\|center\|400px\|The combined effects of voltage and temperature on the reliability, as plotted in ALTA.]]
	<br>		<br>
	<br>		<br>

Nikki Helms: /* Electronic Devices Example */

2012-04-02T17:49:26Z

Electronic Devices Example

← Older revision		Revision as of 17:49, 2 April 2012
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	<br>		<br>
	<br>		<br>
	[[Image:11_2ex.~~gif\|thumb~~\|center\|300px\|]]		[[Image:11_2ex.png\|center\|300px\|]]
	<br>		<br>
	Do the following:		Do the following:

Athanasios Gerokostopoulos: Created page with '===Electronic Devices Example===
Twelve electronic devices were put into a continuous accelerated test. The accelerated stresses were temperature and voltage, with use leve…'

2012-03-21T17:33:54Z

Created page with '===Electronic Devices Example=== Twelve electronic devices were put into a continuous accelerated test. The accelerated stresses were temperature and voltage, with use leve…'

New page

===Electronic Devices Example===

 
Twelve electronic devices were put into a continuous accelerated test. The accelerated stresses were temperature and voltage, with use level conditions of 328K and 2V respectively. The data set obtained is shown in the table below:
 
 
[[Image:11_2ex.gif|thumb|center|300px|]]
 
Do the following:

1) Using the T-NT Weibull model, analyze the data in ALTA and determine the MTTF and B(10) life for these devices at use level. Determine the upper and lower 90% 2-sided confidence intervals on the results.

2) Examine the effects of each stress on life.

====Solution====

1. The data set was analyzed in ALTA and the following MTTF and <math>B(10)</math> life results were obtained: (''The results are shown in ALTA's QCP in the following figures.'')

 
[[Image:pv_ex2_1.gif|thumb|center|300px|]]

 
[[Image:pv_ex2_2.gif|thumb|center|300px|]]
 
 

2. The next two figures examine the effects of each stress on life.

 
Specifically, the next figure shows the Life vs. Voltage plot with temperature held constant at 328K.

[[Image:ALTA14.6.gif|thumb|center|300px|The effects of voltage on life, with temperature held constant at 328K.]]

The next figure shows the Life vs. Temperature plot with voltage held constant at 2V.

 
[[Image:ALTA14.7.gif|thumb|center|300px|The effects of temperature on life, with voltage held constant at 2V.]]
 
 
The next figure shows a 3D plot of reliability (at a constant time) versus both stresses. One can observe that reliability declines slightly faster with the change in temperature than with the change in voltage. Note that in the following plot, Stress 1 refers to temperature and Stress 2 refers to voltage.

[[Image:ALTA14.8.gif|thumb|center|300px|The combined effects of voltage and temperature on the reliability, as plotted in ALTA.]]

Electronic Devices Example - Revision history

Lisa Hacker at 02:48, 16 August 2012

Kate Racaza at 04:25, 15 August 2012

Kate Racaza: moved Template:Electronic Devices Example to Electronic Devices Example: incorrect namespace

Richard House at 07:03, 9 August 2012

Chris Kahn: /* Electronic Devices Example */

Chuck Smith: /* Electronic Devices Example */

Nicolette Young: /* Electronic Devices Example */

Nikki Helms: /* Electronic Devices Example */

Athanasios Gerokostopoulos: Created page with '===Electronic Devices Example=== Twelve electronic devices were put into a continuous accelerated test. The accelerated stresses were temperature and voltage, with use leve…'

Athanasios Gerokostopoulos: Created page with '===Electronic Devices Example===
Twelve electronic devices were put into a continuous accelerated test. The accelerated stresses were temperature and voltage, with use leve…'