Generalized Eyring Example: Difference between revisions

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''This example appears in the [[Eyring_Relationship#Generalized_Eyring_Relationship|Accelerated Life Testing Data Analysis Reference]] book.''
''This example appears in the [https://help.reliasoft.com/reference/accelerated_life_testing_data_analysis Accelerated life testing reference].''


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Latest revision as of 19:03, 18 September 2023

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This example appears in the Accelerated life testing reference.


The following data set represents failure times (in hours) obtained from an electronics epoxy packaging accelerated life test performed to understand the synergy between temperature and humidity and estimate the [math]\displaystyle{ B10\,\! }[/math] life at the use conditions of [math]\displaystyle{ T=350K\,\! }[/math] and [math]\displaystyle{ H=0.3\,\! }[/math]. The data set is modeled using the lognormal distribution and the generalized Eyring model.

406-1-2.png

The probability plot at the use conditions is shown next.

Plotfolio426.png

The [math]\displaystyle{ B10\,\! }[/math] information is estimated to be 1967.2 hours, as shown next.

TempBX.png