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| ==Generalized Eyring Example==
| | #REDIRECT [[Generalized_Eyring_Example]] |
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| The following data set represents failure times (in hours) obtained from an electronics epoxy packaging accelerated life test performed to understand the synergy between temperature and humidity and estimate the <math>B10</math> life at the use conditions of <math>T=350K</math> and <math>H=0.3</math> . The data set is modeled using the lognormal distribution and the generalized Eyring model.
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| [[Image:406-1-2.png|center|675px|]] | |
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| The probability plot at the use conditions is shown next.
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| [[Image:plotfolio426.png|center|550px|]]
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| The <math>B10</math> information is estimated to be 1967.2 hours, as shown next.
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| [[Image:tempBX.png|center|500px|]]
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