Appendix D: References: Difference between revisions

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===References===


# Aitchison, J., Jr. and Brown, J.A.C.,  <math>The</math>  <math>Lognormal</math>  <math>Distribution</math> , Cambridge University Press, New York, 176 pp., 1957.
# Aitchison, J., Jr. and Brown, J.A.C.,  <math>The</math>  <math>Lognormal</math>  <math>Distribution</math> , Cambridge University Press, New York, 176 pp., 1957.
# Cramer, H.,  <math>Mathematical</math>  <math>Methods</math>  <math>of</math>  <math>Statistics</math> , Princeton University Press, Princeton, NJ, 1946.
# Cramer, H.,  <math>Mathematical</math>  <math>Methods</math>  <math>of</math>  <math>Statistics</math> , Princeton University Press, Princeton, NJ, 1946.
# Cox, F. R., and Lewis, P.A. W. (1966), The Statistical Analysis of Series of Events, London: Methuen.
# Cox, F. R., and Lewis, P.A. W. (1966), The Statistical Analysis of Series of Events, London: Methuen.
# Davis, D.J., ``An Analysis of Some Failure Data,'' J. Am. Stat. Assoc., Vol. 47, p. 113, 1952.
# Davis, D.J., ``An Analysis of Some Failure Data,'' J. Am. Stat. Assoc., Vol. 47, p. 113, 1952.
# Dietrich, D.,  <math>SIE</math>  <math>530</math>  <math>Engineering</math>  <math>Statistics</math>  <math>Lecture</math>  <math>Notes</math> , The University of Arizona, Tucson, Arizona.
# Dietrich, D.,  <math>SIE</math>  <math>530</math>  <math>Engineering</math>  <math>Statistics</math>  <math>Lecture</math>  <math>Notes</math> , The University of Arizona, Tucson, Arizona.
# Dudewicz, E.J., ``An Analysis of Some Failure Data,'' J. Am. Stat. Assoc., Vol. 47, p. 113, 1952.
# Dudewicz, E.J., ``An Analysis of Some Failure Data,'' J. Am. Stat. Assoc., Vol. 47, p. 113, 1952.
# Dudewicz, E.J., and Mishra, Satya N.,  <math>Modern</math>  <math>Mathematical</math>  <math>Statistics</math> , John Wiley & Sons, Inc., New York, 1988.
# Dudewicz, E.J., and Mishra, Satya N.,  <math>Modern</math>  <math>Mathematical</math>  <math>Statistics</math> , John Wiley & Sons, Inc., New York, 1988.
# Evans, Ralph A., ``The Lognormal Distribution is Not a Wearout Distribution,'' Reliability Group Newsletter, IEEE, Inc., 345 East 47 <math>^{th}</math>  St., New York, N.Y. 10017, p. 9, Vol. XV, Issue 1, January 1970.
# Evans, Ralph A., ``The Lognormal Distribution is Not a Wearout Distribution,'' Reliability Group Newsletter, IEEE, Inc., 345 East 47 <math>^{th}</math>  St., New York, N.Y. 10017, p. 9, Vol. XV, Issue 1, January 1970.


Revision as of 00:13, 25 June 2011

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  1. Aitchison, J., Jr. and Brown, J.A.C., [math]\displaystyle{ The }[/math] [math]\displaystyle{ Lognormal }[/math] [math]\displaystyle{ Distribution }[/math] , Cambridge University Press, New York, 176 pp., 1957.
  2. Cramer, H., [math]\displaystyle{ Mathematical }[/math] [math]\displaystyle{ Methods }[/math] [math]\displaystyle{ of }[/math] [math]\displaystyle{ Statistics }[/math] , Princeton University Press, Princeton, NJ, 1946.
  3. Cox, F. R., and Lewis, P.A. W. (1966), The Statistical Analysis of Series of Events, London: Methuen.
  4. Davis, D.J., ``An Analysis of Some Failure Data, J. Am. Stat. Assoc., Vol. 47, p. 113, 1952.
  5. Dietrich, D., [math]\displaystyle{ SIE }[/math] [math]\displaystyle{ 530 }[/math] [math]\displaystyle{ Engineering }[/math] [math]\displaystyle{ Statistics }[/math] [math]\displaystyle{ Lecture }[/math] [math]\displaystyle{ Notes }[/math] , The University of Arizona, Tucson, Arizona.
  6. Dudewicz, E.J., ``An Analysis of Some Failure Data, J. Am. Stat. Assoc., Vol. 47, p. 113, 1952.
  7. Dudewicz, E.J., and Mishra, Satya N., [math]\displaystyle{ Modern }[/math] [math]\displaystyle{ Mathematical }[/math] [math]\displaystyle{ Statistics }[/math] , John Wiley & Sons, Inc., New York, 1988.
  8. Evans, Ralph A., ``The Lognormal Distribution is Not a Wearout Distribution, Reliability Group Newsletter, IEEE, Inc., 345 East 47 [math]\displaystyle{ ^{th} }[/math] St., New York, N.Y. 10017, p. 9, Vol. XV, Issue 1, January 1970.
  1. Gelman, A., Carlin, John B., Stern, Hal S., and Rubin, Donald B., Bayesian Data Analysis, Second Edition, Chapman & Hall/CRC, New York 2004
  1. Gottfried, Paul, Wear-out, Reliability Group Newsletter, IEEE, Inc., 345 East 47 [math]\displaystyle{ ^{th} }[/math] St., New York, N.Y. 10017, p. 7, Vol. XV, Issue 3, July 1970.

• Hahn, Gerald J., and Shapiro, Samuel S., [math]\displaystyle{ Statistical }[/math] [math]\displaystyle{ Models }[/math] [math]\displaystyle{ in }[/math] [math]\displaystyle{ Engineer }[/math] - [math]\displaystyle{ ing }[/math] , John Wiley & Sons, Inc., New York, 355 pp., 1967.

  1. Hald, A., [math]\displaystyle{ Statistical }[/math] [math]\displaystyle{ Theory }[/math] [math]\displaystyle{ with }[/math] [math]\displaystyle{ Engineering }[/math] [math]\displaystyle{ Applications }[/math] , John Wiley & Sons, Inc., New York, 783 pp., 1952.

• Hald, A., [math]\displaystyle{ Statistical }[/math] [math]\displaystyle{ Tables }[/math] [math]\displaystyle{ and }[/math] [math]\displaystyle{ Formulas }[/math] , John Wiley & Sons, Inc., New York, 97 pp., 1952.

  1. Hirose, Hideo, ``Maximum Likelihood Estimation in the 3-parameter Weibull Distribution - A Look through the Generalized Extreme-value Distribution, IEEE Transactions on Dielectrics and Electrical Insulation, Vol. 3, No. 1, pp. 43-55, February 1996.
  1. Johnson, Leonard G., ``The Median Ranks of Sample Values in their Population With an Application to Certain Fatigue Studies, Industrial Mathematics, Vol. 2, 1951.
  1. Johnson, Leonard G., [math]\displaystyle{ The }[/math] [math]\displaystyle{ Statistical }[/math] [math]\displaystyle{ Treatment }[/math] [math]\displaystyle{ of }[/math] [math]\displaystyle{ Fatigue }[/math] [math]\displaystyle{ Experi }[/math] - [math]\displaystyle{ ment }[/math] , Elsevier Publishing Company, New York, 144 pp., 1964.
  1. Kao, J.H.K., ``A New Life Quality Measure for Electron Tubes, IRE Transaction on Reliability and Quality Control, PGRQC 13, pp. 15-22, July 1958.
  1. Kapur, K.C., and Lamberson, L.R., [math]\displaystyle{ Reliability }[/math] [math]\displaystyle{ in }[/math] [math]\displaystyle{ Engineering }[/math] [math]\displaystyle{ Design }[/math] , John Wiley & Sons, Inc., New York, 586 pp., 1977.
  1. Kececioglu, Dimitri, [math]\displaystyle{ Reliability }[/math] [math]\displaystyle{ Engineering }[/math] [math]\displaystyle{ Handbook }[/math] , Prentice Hall, Inc., Englewood Cliffs, New Jersey, Vol. 1, 1991.
  1. Kececioglu, Dimitri, [math]\displaystyle{ Reliability }[/math] [math]\displaystyle{ \And }[/math] [math]\displaystyle{ Life }[/math] [math]\displaystyle{ Testing }[/math] [math]\displaystyle{ Handbook }[/math] , Prentice Hall, Inc., Englewood Cliffs, New Jersey, Vol. 1 and 2, 1993 and 1994.
  1. Lawless, J.F., Statistical Models And Methods for Lifetime Data, John Wiley & Sons, Inc., New York, 1982.
  1. Leemis, Lawrence M., [math]\displaystyle{ Reliability-Probabilistic }[/math] [math]\displaystyle{ Models }[/math] [math]\displaystyle{ and }[/math] [math]\displaystyle{ Statistical }[/math] [math]\displaystyle{ Methods }[/math] , Prentice Hall, Inc., Englewood Cliffs, New Jersey, 1995.
  1. Lieblein, J., and Zelen, M., Statistical Investigation of the Fatigue Life of Deep-Groove Ball Bearings, Journal of Research, National Bureau of Standards, Vol. 57, p. 273, 1956.
  1. Lloyd, David K., and Lipow Myron, [math]\displaystyle{ Reliability }[/math] : [math]\displaystyle{ Management, }[/math] [math]\displaystyle{ Methods, }[/math] [math]\displaystyle{ and }[/math] [math]\displaystyle{ Mathematics }[/math] , Prentice Hall, Englewood Cliffs, New Jersey, 1962.
  1. Mann, Nancy R., Schafer, Ray. E., and Singpurwalla, Nozer D., [math]\displaystyle{ Methods }[/math] [math]\displaystyle{ for }[/math] [math]\displaystyle{ Statistical }[/math] [math]\displaystyle{ Analysis }[/math] [math]\displaystyle{ of }[/math] [math]\displaystyle{ Reliability }[/math] [math]\displaystyle{ and }[/math] [math]\displaystyle{ Life }[/math] [math]\displaystyle{ Data }[/math] , John Wiley & Sons, Inc., New York, 1974.
  1. Martz, H. F. and Waller, R. A. Bayesian Reliability Analysis, John Wiley & Sons, Inc., New York, 1982.
  1. Meeker, W.Q., and Escobar, L.A., Statistical Methods for Reliability Data, John Wiley & Sons, Inc., New York, 1998.
  1. Mettas, A, and Zhao, Wenbiao, Modeling and Analysis of Repairable Systems with General Repair, 2005 Proceedings Annual Reliability and Maintainability Symposium, Alexandria, Virginia, 2005.
  1. Montgomery, Douglas C., Design and Analysis of Experiments, John Wiley & Sons, Inc., New York, 1991.
  1. Nelson, Wayne, [math]\displaystyle{ Applied }[/math] [math]\displaystyle{ Life }[/math] [math]\displaystyle{ Data }[/math] [math]\displaystyle{ Analysis }[/math] , John Wiley & Sons, Inc., New York, 1982.
  1. Nelson, Wayne, Recurrent Events Data Analysis for Product Repairs, Disease Recurrences, and Other Applications, ASA-SIAM, 2003.
  1. NIST/SEMATECH e-Handbook of Statistical Methods,

http://www.itl.nist.gov/div898/handbook/, September, 2005.

  1. Perry, J. N., Semiconductor Burn-in and Weibull Statistics, Semiconductor Reliability, Vol. 2, Engineering Publishers, Elizabeth, N.J., pp. 8-90, 1962.
  1. Procassini, A. A., and Romano, A., Transistor Reliability Estimates Improve with Weibull Distribution Function, Motorola Military Products Division, Engineering Bulletin, Vol. 9, No. 2, pp. 16-18, 1961.
  1. Weibull, Wallodi, A Statistical Representation of Fatigue Failure in Solids, Transactions on the Royal Institute of Technology, No. 27, Stockholm, 1949.
  1. Weibull, Wallodi, A Statistical Distribution Function of Wide Applicability, Journal of Applied Mechanics, Vol. 18, pp. 293-297, 1951.
  1. Wingo, Dallas R., Solution of the Three-Parameter Weibull Equations by Constrained Modified Quasilinearization (Progressively Censored Samples), IEEE Transactions on Reliability, Vol. R-22, No. 2, pp. 96-100, June 1973.
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