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| ====Arrhenius-Weibull Reliability Function====
| | #REDIRECT [[Arrhenius_Relationship#Arrhenius-Weibull_Statistical_Properties_Summary]] |
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| The Arrhenius-Weibull reliability function is given by:
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| ::<math>R(T,V)={{e}^{-{{\left( \tfrac{T}{C\cdot {{e}^{\tfrac{B}{V}}}} \right)}^{\beta }}}}</math>
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| If the parameter <math>B</math> is positive, then the reliability increases as stress decreases.
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| [[Image:ALTA6.7.png|center|400px|Behavior of the reliability function at different stress and constant parameter values.]]
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| The behavior of the reliability function of the Weibull distribution for different values of <math>\beta </math> was illustrated [[Distributions used in Accelerated Testing#The Weibull Distribution|here]]. In the case of the Arrhenius-Weibull model, however, the reliability is a function of stress also. A 3D plot such as the ones shown in the next figure is now needed to illustrate the effects of both the stress and <math>\beta .</math>
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| ::<math></math>
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| [[Image:ALTA6.8.png|center|800px|Reliability function for <math>\Beta<1 </math>, <math>\Beta=1 </math>, and <math>\Beta>1 </math>.]]
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