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| | #REDIRECT [[Appendix:_Life_Data_Analysis_References]] |
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| References
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| • Aitchison, J., Jr. and Brown, J.A.C., <math>The</math> <math>Lognormal</math> <math>Distribution</math> , Cambridge University Press, New York, 176 pp., 1957.
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| • Cramer, H., <math>Mathematical</math> <math>Methods</math> <math>of</math> <math>Statistics</math> , Princeton University Press, Princeton, NJ, 1946.
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| • Cox, F. R., and Lewis, P.A. W. (1966), The Statistical Analysis of Series of Events, London: Methuen.
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| • Davis, D.J., ``An Analysis of Some Failure Data,'' J. Am. Stat. Assoc., Vol. 47, p. 113, 1952.
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| • Dietrich, D., <math>SIE</math> <math>530</math> <math>Engineering</math> <math>Statistics</math> <math>Lecture</math> <math>Notes</math> , The University of Arizona, Tucson, Arizona.
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| • Dudewicz, E.J., ``An Analysis of Some Failure Data,'' J. Am. Stat. Assoc., Vol. 47, p. 113, 1952.
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| • Dudewicz, E.J., and Mishra, Satya N., <math>Modern</math> <math>Mathematical</math> <math>Statistics</math> , John Wiley & Sons, Inc., New York, 1988.
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| • Evans, Ralph A., ``The Lognormal Distribution is Not a Wearout Distribution,'' Reliability Group Newsletter, IEEE, Inc., 345 East 47 <math>^{th}</math> St., New York, N.Y. 10017, p. 9, Vol. XV, Issue 1, January 1970.
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| • Gelman, A., Carlin, John B., Stern, Hal S., and Rubin, Donald B., Bayesian Data Analysis, Second Edition, Chapman & Hall/CRC, New York 2004
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| • Gottfried, Paul, Wear-out, Reliability Group Newsletter, IEEE, Inc., 345 East 47 <math>^{th}</math> St., New York, N.Y. 10017, p. 7, Vol. XV, Issue 3, July 1970.
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| • Hahn, Gerald J., and Shapiro, Samuel S., <math>Statistical</math> <math>Models</math> <math>in</math> <math>Engineer</math> - <math>ing</math> , John Wiley & Sons, Inc., New York, 355 pp., 1967.
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| • Hald, A., <math>Statistical</math> <math>Theory</math> <math>with</math> <math>Engineering</math> <math>Applications</math> , John Wiley & Sons, Inc., New York, 783 pp., 1952.
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| • Hald, A., <math>Statistical</math> <math>Tables</math> <math>and</math> <math>Formulas</math> , John Wiley & Sons, Inc., New York, 97 pp., 1952.
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| • Hirose, Hideo, ``Maximum Likelihood Estimation in the 3-parameter Weibull Distribution - A Look through the Generalized Extreme-value Distribution,'' IEEE Transactions on Dielectrics and Electrical Insulation, Vol. 3, No. 1, pp. 43-55, February 1996.
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| • Johnson, Leonard G., ``The Median Ranks of Sample Values in their Population With an Application to Certain Fatigue Studies,'' Industrial Mathematics, Vol. 2, 1951.
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| • Johnson, Leonard G., <math>The</math> <math>Statistical</math> <math>Treatment</math> <math>of</math> <math>Fatigue</math> <math>Experi</math> - <math>ment</math> , Elsevier Publishing Company, New York, 144 pp., 1964.
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| • Kao, J.H.K., ``A New Life Quality Measure for Electron Tubes,'' IRE Transaction on Reliability and Quality Control, PGRQC 13, pp. 15-22, July 1958.
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| • Kapur, K.C., and Lamberson, L.R., <math>Reliability</math> <math>in</math> <math>Engineering</math> <math>Design</math> , John Wiley & Sons, Inc., New York, 586 pp., 1977.
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| • Kececioglu, Dimitri, <math>Reliability</math> <math>Engineering</math> <math>Handbook</math> , Prentice Hall, Inc., Englewood Cliffs, New Jersey, Vol. 1, 1991.
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| • Kececioglu, Dimitri, <math>Reliability</math> <math>\And </math> <math>Life</math> <math>Testing</math> <math>Handbook</math> , Prentice Hall, Inc., Englewood Cliffs, New Jersey, Vol. 1 and 2, 1993 and 1994.
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| • Lawless, J.F., Statistical Models And Methods for Lifetime Data, John Wiley & Sons, Inc., New York, 1982.
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| • Leemis, Lawrence M., <math>Reliability-Probabilistic</math> <math>Models</math> <math>and</math> <math>Statistical</math> <math>Methods</math> , Prentice Hall, Inc., Englewood Cliffs, New Jersey, 1995.
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| • Lieblein, J., and Zelen, M., Statistical Investigation of the Fatigue Life of Deep-Groove Ball Bearings, Journal of Research, National Bureau of Standards, Vol. 57, p. 273, 1956.
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| • Lloyd, David K., and Lipow Myron, <math>Reliability</math> : <math>Management,</math> <math>Methods,</math> <math>and</math> <math>Mathematics</math> , Prentice Hall, Englewood Cliffs, New Jersey, 1962.
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| • Mann, Nancy R., Schafer, Ray. E., and Singpurwalla, Nozer D., <math>Methods</math> <math>for</math> <math>Statistical</math> <math>Analysis</math> <math>of</math> <math>Reliability</math> <math>and</math> <math>Life</math> <math>Data</math> , John Wiley & Sons, Inc., New York, 1974.
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| • Martz, H. F. and Waller, R. A. Bayesian Reliability Analysis, John Wiley & Sons, Inc., New York, 1982.
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| • Meeker, W.Q., and Escobar, L.A., Statistical Methods for Reliability Data, John Wiley & Sons, Inc., New York, 1998.
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| • Mettas, A, and Zhao, Wenbiao, Modeling and Analysis of Repairable Systems with General Repair, 2005 Proceedings Annual Reliability and Maintainability Symposium, Alexandria, Virginia, 2005.
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| • Montgomery, Douglas C., Design and Analysis of Experiments, John Wiley & Sons, Inc., New York, 1991.
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| • Nelson, Wayne, <math>Applied</math> <math>Life</math> <math>Data</math> <math>Analysis</math> , John Wiley & Sons, Inc., New York, 1982.
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| • Nelson, Wayne, Recurrent Events Data Analysis for Product Repairs, Disease Recurrences, and Other Applications, ASA-SIAM, 2003.
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| • NIST/SEMATECH e-Handbook of Statistical Methods,
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| http://www.itl.nist.gov/div898/handbook/, September, 2005.
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| • Perry, J. N., Semiconductor Burn-in and Weibull Statistics, Semiconductor Reliability, Vol. 2, Engineering Publishers, Elizabeth, N.J., pp. 8-90, 1962.
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| • Procassini, A. A., and Romano, A., Transistor Reliability Estimates Improve with Weibull Distribution Function, Motorola Military Products Division, Engineering Bulletin, Vol. 9, No. 2, pp. 16-18, 1961.
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| • Weibull, Wallodi, A Statistical Representation of Fatigue Failure in Solids, Transactions on the Royal Institute of Technology, No. 27, Stockholm, 1949.
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| • Weibull, Wallodi, A Statistical Distribution Function of Wide Applicability, Journal of Applied Mechanics, Vol. 18, pp. 293-297, 1951.
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| • Wingo, Dallas R., Solution of the Three-Parameter Weibull Equations by Constrained Modified Quasilinearization (Progressively Censored Samples), IEEE Transactions on Reliability, Vol. R-22, No. 2, pp. 96-100, June 1973.
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| [[Category:UNEDITED_Communications]]
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| [[Category:UNEDITED_Theoretical]]
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