Appendix: Life Data Analysis References - Revision history

Lisa Hacker at 19:15, 15 September 2023

2023-09-15T19:15:27Z

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	{{Template:~~LDABOOK_SUB~~\|Appendix E\|Life Data Analysis References}}		{{Template:LDABOOK\|Appendix E\|Life Data Analysis References}}

	#Aitchison, J., Jr. and Brown, J.A.C., The Lognormal Distribution, Cambridge University Press, New York, 176 pp., 1957.		#Aitchison, J., Jr. and Brown, J.A.C., The Lognormal Distribution, Cambridge University Press, New York, 176 pp., 1957.

Harry Guo at 23:31, 18 October 2012

2012-10-18T23:31:12Z

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	#Wingo, Dallas R., "Solution of the Three-Parameter Weibull Equations by Constrained Modified Quasilinearization (Progressively Censored Samples)," IEEE Transactions on Reliability, Vol. R-22, No. 2, pp. 96-100, June 1973.		#Wingo, Dallas R., "Solution of the Three-Parameter Weibull Equations by Constrained Modified Quasilinearization (Progressively Censored Samples)," IEEE Transactions on Reliability, Vol. R-22, No. 2, pp. 96-100, June 1973.
	#Guo, Huairui, Jin, Tongdan, and Mettas, Adamantios. "Design Reliability Demonstration Tests for One-Shot Systems Under Zero Component Failure," IEEE Transactions on Reliability, Vol. 60, No. 1, pp. 286-294, March 2011.		#Guo, Huairui, Jin, Tongdan, and Mettas, Adamantios. "Design Reliability Demonstration Tests for One-Shot Systems Under Zero Component Failure," IEEE Transactions on Reliability, Vol. 60, No. 1, pp. 286-294, March 2011.
			#Hirose, H. “Bias Correction for the Maximum Likelihood Estimation in Two-parameter Weibull Distribution,” IEEE Transactions on Dielectrics and Electrical Insulation, Vol. 6, No.1, February 1999.
	#Ross, R. “Bias and Standard Deviation Due to Weibull Parameter Estimation for Small Data Sets,” IEEE Transactions on Dielectrics and Electrical Insulation, Vol. 3, No.1, February 1996.		#Ross, R. “Bias and Standard Deviation Due to Weibull Parameter Estimation for Small Data Sets,” IEEE Transactions on Dielectrics and Electrical Insulation, Vol. 3, No.1, February 1996.
	~~#Hirose, H. “Bias Correction for the Maximum Likelihood Estimation in Two-parameter Weibull Distribution,” IEEE Transactions on Dielectrics and Electrical Insulation, Vol. 6, No.1, February 1999.~~

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Harry Guo at 23:28, 18 October 2012

2012-10-18T23:28:28Z

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	#Wingo, Dallas R., "Solution of the Three-Parameter Weibull Equations by Constrained Modified Quasilinearization (Progressively Censored Samples)," IEEE Transactions on Reliability, Vol. R-22, No. 2, pp. 96-100, June 1973.		#Wingo, Dallas R., "Solution of the Three-Parameter Weibull Equations by Constrained Modified Quasilinearization (Progressively Censored Samples)," IEEE Transactions on Reliability, Vol. R-22, No. 2, pp. 96-100, June 1973.
	#Guo, Huairui, Jin, Tongdan, and Mettas, Adamantios. "Design Reliability Demonstration Tests for One-Shot Systems Under Zero Component Failure," IEEE Transactions on Reliability, Vol. 60, No. 1, pp. 286-294, March 2011.		#Guo, Huairui, Jin, Tongdan, and Mettas, Adamantios. "Design Reliability Demonstration Tests for One-Shot Systems Under Zero Component Failure," IEEE Transactions on Reliability, Vol. 60, No. 1, pp. 286-294, March 2011.
			#Ross, R. “Bias and Standard Deviation Due to Weibull Parameter Estimation for Small Data Sets,” IEEE Transactions on Dielectrics and Electrical Insulation, Vol. 3, No.1, February 1996.
			#Hirose, H. “Bias Correction for the Maximum Likelihood Estimation in Two-parameter Weibull Distribution,” IEEE Transactions on Dielectrics and Electrical Insulation, Vol. 6, No.1, February 1999.

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Melinda Caroline at 02:20, 17 August 2012

2012-08-17T02:20:11Z

Melinda Caroline at 02:17, 17 August 2012

2012-08-17T02:17:46Z

Kate Racaza at 09:25, 5 July 2012

2012-07-05T09:25:23Z

← Older revision		Revision as of 09:25, 5 July 2012
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	{{Template:LDABOOK_SUB\|Appendix D\|Life Data Analysis References}}		{{Template:LDABOOK_SUB\|Appendix E\|Life Data Analysis References}}

	1.Aitchison, J., Jr. and Brown, J.A.C., The Lognormal Distribution, Cambridge University Press, New York, 176 pp., 1957.		1.Aitchison, J., Jr. and Brown, J.A.C., The Lognormal Distribution, Cambridge University Press, New York, 176 pp., 1957.

Kate Racaza at 09:20, 2 July 2012

2012-07-02T09:20:18Z

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	==Life Data Analysis References==		{{Template:LDABOOK_SUB\|Appendix D\|Life Data Analysis References}}

	1.Aitchison, J., Jr. and Brown, J.A.C., The Lognormal Distribution, Cambridge University Press, New York, 176 pp., 1957.		1.Aitchison, J., Jr. and Brown, J.A.C., The Lognormal Distribution, Cambridge University Press, New York, 176 pp., 1957.

Lisa Hacker: moved Appendix: Weibull References to Appendix: Life Data Analysis References

2012-03-30T01:08:53Z

moved Appendix: Weibull References to Appendix: Life Data Analysis References

← Older revision	Revision as of 01:08, 30 March 2012
(No difference)

Harry Guo at 17:59, 23 February 2012

2012-02-23T17:59:14Z

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	37.Wingo, Dallas R., "Solution of the Three-Parameter Weibull Equations by Constrained Modified Quasilinearization (Progressively Censored Samples)," IEEE Transactions on Reliability, Vol. R-22, No. 2, pp. 96-100, June 1973.		37.Wingo, Dallas R., "Solution of the Three-Parameter Weibull Equations by Constrained Modified Quasilinearization (Progressively Censored Samples)," IEEE Transactions on Reliability, Vol. R-22, No. 2, pp. 96-100, June 1973.

			38. Guo, Huairui, Jin, Tongdan, and Mettas, Adamantios. "Design Reliability Demonstration Tests for One-Shot Systems Under Zero Component Failure," IEEE Transactions on Reliability, Vol. 60, No. 1, pp. 286-294, March 2011.


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Harry Guo: moved Appendix D: Weibull References to Appendix: Weibull References

2012-02-06T22:37:31Z

moved Appendix D: Weibull References to Appendix: Weibull References

← Older revision	Revision as of 22:37, 6 February 2012
(No difference)

← Older revision		Revision as of 02:20, 17 August 2012
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	#Aitchison, J., Jr. and Brown, J.A.C., The Lognormal Distribution, Cambridge University Press, New York, 176 pp., 1957.		#Aitchison, J., Jr. and Brown, J.A.C., The Lognormal Distribution, Cambridge University Press, New York, 176 pp., 1957.

	#Cramer, H., Mathematical Methods of Statistics, Princeton University Press, Princeton, NJ, 1946.		#Cramer, H., Mathematical Methods of Statistics, Princeton University Press, Princeton, NJ, 1946.

	#Cox, F. R., and Lewis, P.A. W. (1966), The Statistical Analysis of Series of Events, London: Methuen.		#Cox, F. R., and Lewis, P.A. W. (1966), The Statistical Analysis of Series of Events, London: Methuen.

	#Davis, D.J., "An Analysis of Some Failure Data," J. Am. Stat. Assoc., Vol. 47, p. 113, 1952.		#Davis, D.J., "An Analysis of Some Failure Data," J. Am. Stat. Assoc., Vol. 47, p. 113, 1952.

	#Dietrich, D., SIE 530 Engineering Statistics Lecture Notes, The University of Arizona, Tucson, Arizona.		#Dietrich, D., SIE 530 Engineering Statistics Lecture Notes, The University of Arizona, Tucson, Arizona.

	#Dudewicz, E.J., "An Analysis of Some Failure Data," J. Am. Stat. Assoc., Vol. 47, p. 113, 1952.		#Dudewicz, E.J., "An Analysis of Some Failure Data," J. Am. Stat. Assoc., Vol. 47, p. 113, 1952.

	#Dudewicz, E.J., and Mishra, Satya N., Modern Mathematical Statistics, John Wiley & Sons, Inc., New York, 1988.		#Dudewicz, E.J., and Mishra, Satya N., Modern Mathematical Statistics, John Wiley & Sons, Inc., New York, 1988.

	#Evans, Ralph A., "The Lognormal Distribution is Not a Wearout Distribution," Reliability Group Newsletter, IEEE, Inc., 345 East 47th St., New York, N.Y. 10017, p. 9, Vol. XV, Issue 1, January 1970.		#Evans, Ralph A., "The Lognormal Distribution is Not a Wearout Distribution," Reliability Group Newsletter, IEEE, Inc., 345 East 47th St., New York, N.Y. 10017, p. 9, Vol. XV, Issue 1, January 1970.

	#Gelman, A., Carlin, John B., Stern, Hal S., and Rubin, Donald B., Bayesian Data Analysis, Second Edition, Chapman & Hall/CRC, New York 2004.		#Gelman, A., Carlin, John B., Stern, Hal S., and Rubin, Donald B., Bayesian Data Analysis, Second Edition, Chapman & Hall/CRC, New York 2004.

	#Gottfried, Paul, "Wear-out," Reliability Group Newsletter, IEEE, Inc., 345 East 47th St., New York, N.Y. 10017, p. 7, Vol. XV, Issue 3, July 1970.		#Gottfried, Paul, "Wear-out," Reliability Group Newsletter, IEEE, Inc., 345 East 47th St., New York, N.Y. 10017, p. 7, Vol. XV, Issue 3, July 1970.

	#Hahn, Gerald J., and Shapiro, Samuel S., Statistical Models in Engineering, John Wiley & Sons, Inc., New York, 355 pp., 1967.		#Hahn, Gerald J., and Shapiro, Samuel S., Statistical Models in Engineering, John Wiley & Sons, Inc., New York, 355 pp., 1967.

	#Hald, A., Statistical Theory with Engineering Applications, John Wiley & Sons, Inc., New York, 783 pp., 1952.		#Hald, A., Statistical Theory with Engineering Applications, John Wiley & Sons, Inc., New York, 783 pp., 1952.

	#Hald, A., Statistical Tables and Formulas, John Wiley & Sons, Inc., New York, 97 pp., 1952.		#Hald, A., Statistical Tables and Formulas, John Wiley & Sons, Inc., New York, 97 pp., 1952.

	#Hirose, Hideo, "Maximum Likelihood Estimation in the 3-parameter Weibull Distribution - A Look through the Generalized Extreme-value Distribution," IEEE Transactions on Dielectrics and Electrical Insulation, Vol. 3, No. 1, pp. 43-55, February 1996.		#Hirose, Hideo, "Maximum Likelihood Estimation in the 3-parameter Weibull Distribution - A Look through the Generalized Extreme-value Distribution," IEEE Transactions on Dielectrics and Electrical Insulation, Vol. 3, No. 1, pp. 43-55, February 1996.

	#Johnson, Leonard G., "The Median Ranks of Sample Values in their Population With an Application to Certain Fatigue Studies," Industrial Mathematics, Vol. 2, 1951.		#Johnson, Leonard G., "The Median Ranks of Sample Values in their Population With an Application to Certain Fatigue Studies," Industrial Mathematics, Vol. 2, 1951.

	#Johnson, Leonard G., The Statistical Treatment of Fatigue Experiment, Elsevier Publishing Company, New York, 144 pp., 1964.		#Johnson, Leonard G., The Statistical Treatment of Fatigue Experiment, Elsevier Publishing Company, New York, 144 pp., 1964.

	#Kao, J.H.K., "A New Life Quality Measure for Electron Tubes," IRE Transaction on Reliability and Quality Control, PGRQC 13, pp. 15-22, July 1958.		#Kao, J.H.K., "A New Life Quality Measure for Electron Tubes," IRE Transaction on Reliability and Quality Control, PGRQC 13, pp. 15-22, July 1958.

	#Kapur, K.C., and Lamberson, L.R., Reliability in Engineering Design, John Wiley & Sons, Inc., New York, 586 pp., 1977.		#Kapur, K.C., and Lamberson, L.R., Reliability in Engineering Design, John Wiley & Sons, Inc., New York, 586 pp., 1977.

	#Kececioglu, Dimitri, Reliability Engineering Handbook, Prentice Hall, Inc., Englewood Cliffs, New Jersey, Vol. 1, 1991.		#Kececioglu, Dimitri, Reliability Engineering Handbook, Prentice Hall, Inc., Englewood Cliffs, New Jersey, Vol. 1, 1991.

	#Kececioglu, Dimitri, Reliability & Life Testing Handbook, Prentice Hall, Inc., Englewood Cliffs, New Jersey, Vol. 1 and 2, 1993 and 1994.		#Kececioglu, Dimitri, Reliability & Life Testing Handbook, Prentice Hall, Inc., Englewood Cliffs, New Jersey, Vol. 1 and 2, 1993 and 1994.

	#Lawless, J.F., Statistical Models And Methods for Lifetime Data, John Wiley & Sons, Inc., New York, 1982.		#Lawless, J.F., Statistical Models And Methods for Lifetime Data, John Wiley & Sons, Inc., New York, 1982.

	#Leemis, Lawrence M., Reliability - Probabilistic Models and Statistical Methods, Prentice Hall, Inc., Englewood Cliffs, New Jersey, 1995.		#Leemis, Lawrence M., Reliability - Probabilistic Models and Statistical Methods, Prentice Hall, Inc., Englewood Cliffs, New Jersey, 1995.

	#Lieblein, J., and Zelen, M., "Statistical Investigation of the Fatigue Life of Deep-Groove Ball Bearings," Journal of Research, National Bureau of Standards, Vol. 57, p. 273, 1956.		#Lieblein, J., and Zelen, M., "Statistical Investigation of the Fatigue Life of Deep-Groove Ball Bearings," Journal of Research, National Bureau of Standards, Vol. 57, p. 273, 1956.

	#Lloyd, David K., and Lipow Myron, Reliability: Management, Methods, and Mathematics, Prentice Hall, Englewood Cliffs, New Jersey, 1962.		#Lloyd, David K., and Lipow Myron, Reliability: Management, Methods, and Mathematics, Prentice Hall, Englewood Cliffs, New Jersey, 1962.

	#Mann, Nancy R., Schafer, Ray. E., and Singpurwalla, Nozer D., Methods for Statistical Analysis of Reliability and Life Data, John Wiley & Sons, Inc., New York, 1974.		#Mann, Nancy R., Schafer, Ray. E., and Singpurwalla, Nozer D., Methods for Statistical Analysis of Reliability and Life Data, John Wiley & Sons, Inc., New York, 1974.

	#Martz, H. F. and Waller, R. A. Bayesian Reliability Analysis, John Wiley & Sons, Inc., New York, 1982.		#Martz, H. F. and Waller, R. A. Bayesian Reliability Analysis, John Wiley & Sons, Inc., New York, 1982.

	#Meeker, W.Q., and Escobar, L.A., Statistical Methods for Reliability Data, John Wiley & Sons, Inc., New York, 1998.		#Meeker, W.Q., and Escobar, L.A., Statistical Methods for Reliability Data, John Wiley & Sons, Inc., New York, 1998.

	#Mettas, A, and Zhao, Wenbiao, "Modeling and Analysis of Repairable Systems with General Repair," 2005 Proceedings Annual Reliability and Maintainability Symposium, Alexandria, Virginia, 2005.		#Mettas, A, and Zhao, Wenbiao, "Modeling and Analysis of Repairable Systems with General Repair," 2005 Proceedings Annual Reliability and Maintainability Symposium, Alexandria, Virginia, 2005.

	#Montgomery, Douglas C., Design and Analysis of Experiments, John Wiley & Sons, Inc., New York, 1991.		#Montgomery, Douglas C., Design and Analysis of Experiments, John Wiley & Sons, Inc., New York, 1991.

	#Nelson, Wayne, Applied Life Data Analysis, John Wiley & Sons, Inc., New York, 1982.		#Nelson, Wayne, Applied Life Data Analysis, John Wiley & Sons, Inc., New York, 1982.

	#Nelson, Wayne, Recurrent Events Data Analysis for Product Repairs, Disease Recurrences, and Other Applications, ASA-SIAM, 2003.		#Nelson, Wayne, Recurrent Events Data Analysis for Product Repairs, Disease Recurrences, and Other Applications, ASA-SIAM, 2003.

	#NIST/SEMATECH e-Handbook of Statistical Methods, http://www.itl.nist.gov/div898/handbook/, September, 2005.		#NIST/SEMATECH e-Handbook of Statistical Methods, http://www.itl.nist.gov/div898/handbook/, September, 2005.

	#Perry, J. N., "Semiconductor Burn-in and Weibull Statistics," Semiconductor Reliability, Vol. 2, Engineering Publishers, Elizabeth, N.J., pp. 8-90, 1962.		#Perry, J. N., "Semiconductor Burn-in and Weibull Statistics," Semiconductor Reliability, Vol. 2, Engineering Publishers, Elizabeth, N.J., pp. 8-90, 1962.

	#Procassini, A. A., and Romano, A., "Transistor Reliability Estimates Improve with Weibull Distribution Function," Motorola Military Products Division, Engineering Bulletin, Vol. 9, No. 2, pp. 16-18, 1961.		#Procassini, A. A., and Romano, A., "Transistor Reliability Estimates Improve with Weibull Distribution Function," Motorola Military Products Division, Engineering Bulletin, Vol. 9, No. 2, pp. 16-18, 1961.

	#Weibull, Wallodi, "A Statistical Representation of Fatigue Failure in Solids," Transactions on the Royal Institute of Technology, No. 27, Stockholm, 1949.		#Weibull, Wallodi, "A Statistical Representation of Fatigue Failure in Solids," Transactions on the Royal Institute of Technology, No. 27, Stockholm, 1949.

	#Weibull, Wallodi, "A Statistical Distribution Function of Wide Applicability," Journal of Applied Mechanics, Vol. 18, pp. 293-297, 1951.		#Weibull, Wallodi, "A Statistical Distribution Function of Wide Applicability," Journal of Applied Mechanics, Vol. 18, pp. 293-297, 1951.

	#Wingo, Dallas R., "Solution of the Three-Parameter Weibull Equations by Constrained Modified Quasilinearization (Progressively Censored Samples)," IEEE Transactions on Reliability, Vol. R-22, No. 2, pp. 96-100, June 1973.		#Wingo, Dallas R., "Solution of the Three-Parameter Weibull Equations by Constrained Modified Quasilinearization (Progressively Censored Samples)," IEEE Transactions on Reliability, Vol. R-22, No. 2, pp. 96-100, June 1973.

	#Guo, Huairui, Jin, Tongdan, and Mettas, Adamantios. "Design Reliability Demonstration Tests for One-Shot Systems Under Zero Component Failure," IEEE Transactions on Reliability, Vol. 60, No. 1, pp. 286-294, March 2011.		#Guo, Huairui, Jin, Tongdan, and Mettas, Adamantios. "Design Reliability Demonstration Tests for One-Shot Systems Under Zero Component Failure," IEEE Transactions on Reliability, Vol. 60, No. 1, pp. 286-294, March 2011.


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← Older revision		Revision as of 02:17, 17 August 2012
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	{{Template:LDABOOK_SUB\|Appendix E\|Life Data Analysis References}}		{{Template:LDABOOK_SUB\|Appendix E\|Life Data Analysis References}}

	1.Aitchison, J., Jr. and Brown, J.A.C., The Lognormal Distribution, Cambridge University Press, New York, 176 pp., 1957.		#Aitchison, J., Jr. and Brown, J.A.C., The Lognormal Distribution, Cambridge University Press, New York, 176 pp., 1957.

	2.Cramer, H., Mathematical Methods of Statistics, Princeton University Press, Princeton, NJ, 1946.		#Cramer, H., Mathematical Methods of Statistics, Princeton University Press, Princeton, NJ, 1946.

	3.Cox, F. R., and Lewis, P.A. W. (1966), The Statistical Analysis of Series of Events, London: Methuen.		#Cox, F. R., and Lewis, P.A. W. (1966), The Statistical Analysis of Series of Events, London: Methuen.

	4.Davis, D.J., "An Analysis of Some Failure Data," J. Am. Stat. Assoc., Vol. 47, p. 113, 1952.		#Davis, D.J., "An Analysis of Some Failure Data," J. Am. Stat. Assoc., Vol. 47, p. 113, 1952.

	5.Dietrich, D., SIE 530 Engineering Statistics Lecture Notes, The University of Arizona, Tucson, Arizona.		#Dietrich, D., SIE 530 Engineering Statistics Lecture Notes, The University of Arizona, Tucson, Arizona.

	6.Dudewicz, E.J., "An Analysis of Some Failure Data," J. Am. Stat. Assoc., Vol. 47, p. 113, 1952.		#Dudewicz, E.J., "An Analysis of Some Failure Data," J. Am. Stat. Assoc., Vol. 47, p. 113, 1952.

	7.Dudewicz, E.J., and Mishra, Satya N., Modern Mathematical Statistics, John Wiley & Sons, Inc., New York, 1988.		#Dudewicz, E.J., and Mishra, Satya N., Modern Mathematical Statistics, John Wiley & Sons, Inc., New York, 1988.

	8.Evans, Ralph A., "The Lognormal Distribution is Not a Wearout Distribution," Reliability Group Newsletter, IEEE, Inc., 345 East 47th St., New York, N.Y. 10017, p. 9, Vol. XV, Issue 1, January 1970.		#Evans, Ralph A., "The Lognormal Distribution is Not a Wearout Distribution," Reliability Group Newsletter, IEEE, Inc., 345 East 47th St., New York, N.Y. 10017, p. 9, Vol. XV, Issue 1, January 1970.

	9.Gelman, A., Carlin, John B., Stern, Hal S., and Rubin, Donald B., Bayesian Data Analysis, Second Edition, Chapman & Hall/CRC, New York 2004.		#Gelman, A., Carlin, John B., Stern, Hal S., and Rubin, Donald B., Bayesian Data Analysis, Second Edition, Chapman & Hall/CRC, New York 2004.

	~~10.~~Gottfried, Paul, "Wear-out," Reliability Group Newsletter, IEEE, Inc., 345 East 47th St., New York, N.Y. 10017, p. 7, Vol. XV, Issue 3, July 1970.		#Gottfried, Paul, "Wear-out," Reliability Group Newsletter, IEEE, Inc., 345 East 47th St., New York, N.Y. 10017, p. 7, Vol. XV, Issue 3, July 1970.

	~~11.~~Hahn, Gerald J., and Shapiro, Samuel S., Statistical Models in Engineering, John Wiley & Sons, Inc., New York, 355 pp., 1967.		#Hahn, Gerald J., and Shapiro, Samuel S., Statistical Models in Engineering, John Wiley & Sons, Inc., New York, 355 pp., 1967.

	~~12.~~Hald, A., Statistical Theory with Engineering Applications, John Wiley & Sons, Inc., New York, 783 pp., 1952.		#Hald, A., Statistical Theory with Engineering Applications, John Wiley & Sons, Inc., New York, 783 pp., 1952.

	~~13.~~Hald, A., Statistical Tables and Formulas, John Wiley & Sons, Inc., New York, 97 pp., 1952.		#Hald, A., Statistical Tables and Formulas, John Wiley & Sons, Inc., New York, 97 pp., 1952.

	~~14.~~Hirose, Hideo, "Maximum Likelihood Estimation in the 3-parameter Weibull Distribution - A Look through the Generalized Extreme-value Distribution," IEEE Transactions on Dielectrics and Electrical Insulation, Vol. 3, No. 1, pp. 43-55, February 1996.		#Hirose, Hideo, "Maximum Likelihood Estimation in the 3-parameter Weibull Distribution - A Look through the Generalized Extreme-value Distribution," IEEE Transactions on Dielectrics and Electrical Insulation, Vol. 3, No. 1, pp. 43-55, February 1996.

	~~15.~~Johnson, Leonard G., "The Median Ranks of Sample Values in their Population With an Application to Certain Fatigue Studies," Industrial Mathematics, Vol. 2, 1951.		#Johnson, Leonard G., "The Median Ranks of Sample Values in their Population With an Application to Certain Fatigue Studies," Industrial Mathematics, Vol. 2, 1951.

	~~16.~~Johnson, Leonard G., The Statistical Treatment of Fatigue Experiment, Elsevier Publishing Company, New York, 144 pp., 1964.		#Johnson, Leonard G., The Statistical Treatment of Fatigue Experiment, Elsevier Publishing Company, New York, 144 pp., 1964.

	~~17.~~Kao, J.H.K., "A New Life Quality Measure for Electron Tubes," IRE Transaction on Reliability and Quality Control, PGRQC 13, pp. 15-22, July 1958.		#Kao, J.H.K., "A New Life Quality Measure for Electron Tubes," IRE Transaction on Reliability and Quality Control, PGRQC 13, pp. 15-22, July 1958.

	~~18.~~Kapur, K.C., and Lamberson, L.R., Reliability in Engineering Design, John Wiley & Sons, Inc., New York, 586 pp., 1977.		#Kapur, K.C., and Lamberson, L.R., Reliability in Engineering Design, John Wiley & Sons, Inc., New York, 586 pp., 1977.

	~~19.~~Kececioglu, Dimitri, Reliability Engineering Handbook, Prentice Hall, Inc., Englewood Cliffs, New Jersey, Vol. 1, 1991.		#Kececioglu, Dimitri, Reliability Engineering Handbook, Prentice Hall, Inc., Englewood Cliffs, New Jersey, Vol. 1, 1991.

	~~20.~~Kececioglu, Dimitri, Reliability & Life Testing Handbook, Prentice Hall, Inc., Englewood Cliffs, New Jersey, Vol. 1 and 2, 1993 and 1994.		#Kececioglu, Dimitri, Reliability & Life Testing Handbook, Prentice Hall, Inc., Englewood Cliffs, New Jersey, Vol. 1 and 2, 1993 and 1994.

	~~21.~~Lawless, J.F., Statistical Models And Methods for Lifetime Data, John Wiley & Sons, Inc., New York, 1982.		#Lawless, J.F., Statistical Models And Methods for Lifetime Data, John Wiley & Sons, Inc., New York, 1982.

	~~22.~~Leemis, Lawrence M., Reliability - Probabilistic Models and Statistical Methods, Prentice Hall, Inc., Englewood Cliffs, New Jersey, 1995.		#Leemis, Lawrence M., Reliability - Probabilistic Models and Statistical Methods, Prentice Hall, Inc., Englewood Cliffs, New Jersey, 1995.

	~~23.~~Lieblein, J., and Zelen, M., "Statistical Investigation of the Fatigue Life of Deep-Groove Ball Bearings," Journal of Research, National Bureau of Standards, Vol. 57, p. 273, 1956.		#Lieblein, J., and Zelen, M., "Statistical Investigation of the Fatigue Life of Deep-Groove Ball Bearings," Journal of Research, National Bureau of Standards, Vol. 57, p. 273, 1956.

	~~24.~~Lloyd, David K., and Lipow Myron, Reliability: Management, Methods, and Mathematics, Prentice Hall, Englewood Cliffs, New Jersey, 1962.		#Lloyd, David K., and Lipow Myron, Reliability: Management, Methods, and Mathematics, Prentice Hall, Englewood Cliffs, New Jersey, 1962.

	~~25.~~Mann, Nancy R., Schafer, Ray. E., and Singpurwalla, Nozer D., Methods for Statistical Analysis of Reliability and Life Data, John Wiley & Sons, Inc., New York, 1974.		#Mann, Nancy R., Schafer, Ray. E., and Singpurwalla, Nozer D., Methods for Statistical Analysis of Reliability and Life Data, John Wiley & Sons, Inc., New York, 1974.

	~~26.~~Martz, H. F. and Waller, R. A. Bayesian Reliability Analysis, John Wiley & Sons, Inc., New York, 1982.		#Martz, H. F. and Waller, R. A. Bayesian Reliability Analysis, John Wiley & Sons, Inc., New York, 1982.

	~~27.~~Meeker, W.Q., and Escobar, L.A., Statistical Methods for Reliability Data, John Wiley & Sons, Inc., New York, 1998.		#Meeker, W.Q., and Escobar, L.A., Statistical Methods for Reliability Data, John Wiley & Sons, Inc., New York, 1998.

	~~28.~~Mettas, A, and Zhao, Wenbiao, "Modeling and Analysis of Repairable Systems with General Repair," 2005 Proceedings Annual Reliability and Maintainability Symposium, Alexandria, Virginia, 2005.		#Mettas, A, and Zhao, Wenbiao, "Modeling and Analysis of Repairable Systems with General Repair," 2005 Proceedings Annual Reliability and Maintainability Symposium, Alexandria, Virginia, 2005.

	~~29.~~Montgomery, Douglas C., Design and Analysis of Experiments, John Wiley & Sons, Inc., New York, 1991.		#Montgomery, Douglas C., Design and Analysis of Experiments, John Wiley & Sons, Inc., New York, 1991.

	~~30.~~Nelson, Wayne, Applied Life Data Analysis, John Wiley & Sons, Inc., New York, 1982.		#Nelson, Wayne, Applied Life Data Analysis, John Wiley & Sons, Inc., New York, 1982.

	~~31.~~Nelson, Wayne, Recurrent Events Data Analysis for Product Repairs, Disease Recurrences, and Other Applications, ASA-SIAM, 2003.		#Nelson, Wayne, Recurrent Events Data Analysis for Product Repairs, Disease Recurrences, and Other Applications, ASA-SIAM, 2003.

	~~32.~~NIST/SEMATECH e-Handbook of Statistical Methods, http://www.itl.nist.gov/div898/handbook/, September, 2005.		#NIST/SEMATECH e-Handbook of Statistical Methods, http://www.itl.nist.gov/div898/handbook/, September, 2005.

	~~33.~~Perry, J. N., "Semiconductor Burn-in and Weibull Statistics," Semiconductor Reliability, Vol. 2, Engineering Publishers, Elizabeth, N.J., pp. 8-90, 1962.		#Perry, J. N., "Semiconductor Burn-in and Weibull Statistics," Semiconductor Reliability, Vol. 2, Engineering Publishers, Elizabeth, N.J., pp. 8-90, 1962.

	~~34.~~Procassini, A. A., and Romano, A., "Transistor Reliability Estimates Improve with Weibull Distribution Function," Motorola Military Products Division, Engineering Bulletin, Vol. 9, No. 2, pp. 16-18, 1961.		#Procassini, A. A., and Romano, A., "Transistor Reliability Estimates Improve with Weibull Distribution Function," Motorola Military Products Division, Engineering Bulletin, Vol. 9, No. 2, pp. 16-18, 1961.

	~~35.~~Weibull, Wallodi, "A Statistical Representation of Fatigue Failure in Solids," Transactions on the Royal Institute of Technology, No. 27, Stockholm, 1949.		#Weibull, Wallodi, "A Statistical Representation of Fatigue Failure in Solids," Transactions on the Royal Institute of Technology, No. 27, Stockholm, 1949.

	~~36.~~Weibull, Wallodi, "A Statistical Distribution Function of Wide Applicability," Journal of Applied Mechanics, Vol. 18, pp. 293-297, 1951.		#Weibull, Wallodi, "A Statistical Distribution Function of Wide Applicability," Journal of Applied Mechanics, Vol. 18, pp. 293-297, 1951.

	~~37.~~Wingo, Dallas R., "Solution of the Three-Parameter Weibull Equations by Constrained Modified Quasilinearization (Progressively Censored Samples)," IEEE Transactions on Reliability, Vol. R-22, No. 2, pp. 96-100, June 1973.		#Wingo, Dallas R., "Solution of the Three-Parameter Weibull Equations by Constrained Modified Quasilinearization (Progressively Censored Samples)," IEEE Transactions on Reliability, Vol. R-22, No. 2, pp. 96-100, June 1973.

	~~38.~~ Guo, Huairui, Jin, Tongdan, and Mettas, Adamantios. "Design Reliability Demonstration Tests for One-Shot Systems Under Zero Component Failure," IEEE Transactions on Reliability, Vol. 60, No. 1, pp. 286-294, March 2011.		#Guo, Huairui, Jin, Tongdan, and Mettas, Adamantios. "Design Reliability Demonstration Tests for One-Shot Systems Under Zero Component Failure," IEEE Transactions on Reliability, Vol. 60, No. 1, pp. 286-294, March 2011.


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